Imaging Bias-Driven Domain Wall Motion With Scanning Oscillator Piezoresponse Force Microscopy

Area of Science:

• Materials Science
• Condensed Matter Physics
• Nanotechnology

Background:

• Ferroelectric domain wall dynamics are crucial for understanding materials properties.
• Piezoresponse force microscopy (PFM) has been instrumental in studying domain wall motion.
• Investigating sub-coercive domain wall dynamics requires advanced techniques with high temporal and spatial resolution.

Purpose of the Study:

• To develop and apply a novel technique for visualizing ferroelectric domain wall dynamics.
• To investigate the energetics of field-driven domain wall motion.
• To extend the study of domain wall dynamics to new regimes and timescales.

Main Methods:

• Utilizing scanning oscillator piezoresponse force microscopy (SO-PFM).
• Applying time- and location-varying electric fields.
• Directly visualizing domain wall position as a function of applied electric field.

Main Results:

• SO-PFM enables direct visualization of domain wall position under varying electric fields.
• The study provides insights into the energetics of field-driven ferroelectric domain wall motion.
• Domain wall motion was observed to follow a thermally activated flow regime on the millisecond timescale.

Conclusions:

• Scanning oscillator PFM is a powerful tool for studying nanoscale ferroelectric domain wall dynamics.
• The findings contribute to understanding the fundamental mechanisms governing ferroelectric domain wall behavior.
• This research opens new avenues for exploring ferroelectric materials and devices.