Non-ohmic Devices
Semiconductors
Types of Semiconductors
Biasing of Metal-Semiconductor Junctions
Biasing of FET
Metal-Semiconductor Junctions
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Updated: May 22, 2026

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Mengjiao Li1, Feng-Shou Yang2,3, Yanan Liu1
1School of Microelectronics, Shanghai University, Jiading, Shanghai, China.
This study introduces a novel ferroelectric-van der Waals transistor (FeFET) using Bi2O2Se for advanced AI hardware. The new FeFET offers high reliability and accuracy for neuromorphic computing applications.
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