Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.3K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.3K
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

5.6K
Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
5.6K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

9.7K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
9.7K
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

6.9K
Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...
6.9K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Geometry-aware phase compensation for sampling-efficient angular spectrum method.

Optics express·2026
Same author

Cardiac fibroblast-mediated ECM remodeling regulates maturation in an in vitro 3D engineered cardiac tissue.

Journal of tissue engineering·2025
Same author

Three-dimensional imaging in reflection phase microscopy with minimal axial scanning.

Optics express·2024
Same author

Fourier holographic endoscopy for imaging continuously moving objects.

Optics express·2023
Same author

Investigating the correlation between early vascular alterations and cognitive impairment in Alzheimer's disease in mice with SD-OCT.

Biomedical optics express·2023
Same author

Optical coherence microscopy with a split-spectrum image reconstruction method for temporal-dynamics contrast-based imaging of intracellular motility.

Biomedical optics express·2023
Same journal

Long-term stabilization of intensity-difference squeezing from four-wave mixing in rubidium vapor.

Optics express·2026
Same journal

Robust 3D topography measurement of large-range high-aspect-ratio structures based on dual-domain statistical filtering in SD-OCT.

Optics express·2026
Same journal

Broadband transmissive terahertz metasurface for simultaneous quad-mode OAM multiplexing.

Optics express·2026
Same journal

Leveraging two-dimensional materials for high-sensitivity optical sensors: quasi-bound states in the continuum within hybrid metasurfaces.

Optics express·2026
Same journal

Resolution investigation for dual-spherical-wave optical scanning holographic microscopy: methods and performance.

Optics express·2026
Same journal

Robustness of parallel subnetwork-filtered diffractive deep neural networks.

Optics express·2026
See all related articles

Related Experiment Video

Updated: May 30, 2025

Implementation of Interference Reflection Microscopy for Label-free, High-speed Imaging of Microtubules
09:45

Implementation of Interference Reflection Microscopy for Label-free, High-speed Imaging of Microtubules

Published on: August 8, 2019

10.0K

Wide-area topography using reflection phase microscopy for surface inspection.

Kwanjun Park, Taeseok Daniel Yang, Yong Guk Kang

    Optics Express
    |January 29, 2025
    PubMed
    Summary
    This summary is machine-generated.

    This study presents a reflection phase microscopy system that improves depth range and field of view for precise inspections. The dual-wavelength method achieves a 7.7 µm depth range and 11x11 mm² field of view with 1.30 nm precision.

    More Related Videos

    Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
    10:25

    Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

    Published on: December 20, 2016

    16.6K
    Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy VA-TIRFM
    09:14

    Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy VA-TIRFM

    Published on: October 2, 2012

    10.1K

    Related Experiment Videos

    Last Updated: May 30, 2025

    Implementation of Interference Reflection Microscopy for Label-free, High-speed Imaging of Microtubules
    09:45

    Implementation of Interference Reflection Microscopy for Label-free, High-speed Imaging of Microtubules

    Published on: August 8, 2019

    10.0K
    Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
    10:25

    Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

    Published on: December 20, 2016

    16.6K
    Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy VA-TIRFM
    09:14

    Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy VA-TIRFM

    Published on: October 2, 2012

    10.1K

    Area of Science:

    • Optical Metrology
    • Microscopy Techniques

    Background:

    • Reflection phase microscopy offers potential for high-resolution surface profiling.
    • Existing systems face limitations in depth range and field of view for industrial applications.

    Purpose of the Study:

    • To develop an enhanced inspection system using reflection phase microscopy.
    • To improve both the depth range and field of view (FOV) for precise metrology.

    Main Methods:

    • Implemented a dual-wavelength method to increase depth range.
    • Utilized successive accumulation of interferograms to mitigate phase amplification.
    • Employed error correction algorithms for enhanced image quality.
    • Applied image stitching techniques to achieve a wide field of view.

    Main Results:

    • Achieved a maximum expected depth range of 7.7 µm.
    • Attained a field of view of approximately 11 × 11 mm².
    • Demonstrated a precision of 1.30 nm in measurements.
    • Successfully inspected hole structures on a silicon wafer.

    Conclusions:

    • The developed reflection phase microscopy system significantly enhances depth range and FOV.
    • The system provides high precision for wide-area inspections.
    • This technology holds potential for high-resolution, large-scale industrial applications.