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Interface-Engineered High-Performance Self-Powered Solar-Blind Photodetector Based on NiO/ε-Ga2O3 Heterojunctions
Xiaoli Zhang1,2, Ningtao Liu2, Haobo Lin2
1Faculty of Electrical Engineering and Computer Science, Ningbo University, Ningbo 315211, China.
ACS Applied Materials & Interfaces
|March 6, 2025
Summary
Researchers developed a novel NiO/ε-Ga2O3 solar-blind photodetector. This device suppresses leakage current using a high-resistance interface layer, enhancing sensitivity and response speed for advanced optoelectronic applications.
Area of Science:
- Materials Science
- Optoelectronics
- Semiconductor Physics
Background:
- Self-powered solar-blind photodetectors are crucial for various applications.
- Gallium oxide (Ga2O3) heterojunctions offer potential but suffer from interface leakage current.
- This leakage compromises device sensitivity and response speed.
Purpose of the Study:
- To fabricate a novel NiO/ε-Ga2O3 p-n heterojunction solar-blind photodetector.
- To suppress interface leakage current and enhance device performance.
- To provide a new strategy for developing advanced Ga2O3-based optoelectronic devices.
Main Methods:
- Fabrication of a NiO/ε-Ga2O3 p-n heterojunction.
- Introduction of a high-resistance homogeneous layer at the heterojunction interface.
- Characterization of photodetector performance, including responsivity, detectivity, and response times.
Main Results:
- The NiO/ε-Ga2O3 photodetector successfully suppressed leakage current.
- The high-resistance layer extended the depletion region, improving carrier separation.
- Achieved notable responsivity (160 mA/W), detectivity (3.7 × 1012 Jones), and fast response (38 ms rise, 67 ms decay) at zero bias.
Conclusions:
- The developed NiO/ε-Ga2O3 photodetector demonstrates superior performance compared to previous Ga2O3-based devices.
- The high-resistance interface layer is an effective strategy for mitigating leakage current.
- This work paves the way for advanced self-powered solar-blind photodetectors.
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