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Atom Probe Tomography Analysis of Exsolved Mineral Phases
Published on: October 25, 2019
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An Efficient Method for Preparing High-Quality Atom Probe Tomography Samples of Dual-Phase Ti Alloys
Ruiqing Lu1,2, Felix Theska2, Shenglu Lu3
1School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006, Australia.
Summary
This study introduces a faster method for preparing atom probe tomography (APT) samples of dual-phase titanium (Ti) alloys. Combining electropolishing and focused ion beam (FIB) annular milling reduces preparation time by 40% while maintaining sample quality.
Area of Science:
- Materials Science
- Analytical Chemistry
- Metallurgy
Background:
- Atom probe tomography (APT) sample preparation for dual-phase Ti alloys is challenging.
- Existing focused ion beam (FIB) lift-out methods are time-consuming and require significant expertise.
Purpose of the Study:
- To develop a more efficient and reliable method for APT sample preparation of dual-phase Ti alloys.
- To reduce the time and expertise needed for APT sample preparation.
Main Methods:
- A novel approach combining electropolishing and FIB annular milling was developed.
- Electropolishing was used for pre-sharpening the APT tip.
- FIB annular milling was employed for fine polishing.
Main Results:
- The combined method reduced sample preparation time by 40% compared to the conventional FIB lift-out technique.
- Similar background noise and mass resolution were achieved.
- A reduction in thermal tails in the mass spectrum was observed.
Conclusions:
- The novel electropolishing and FIB annular milling method offers a significant improvement in APT sample preparation efficiency for dual-phase Ti alloys.
- This technique maintains high sample quality, making it a viable alternative to existing methods.
