DFT study of free radical scavenging mechanisms in UiO-66-(OH)2 and UiO-66-NH2 MOFs
Shuai Ke1,2, Bo Wang1, Ganggang Liu3
1Guangxi Key Laboratory of Manufacturing System and Advanced Manufacturing Technology, School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology Guilin 541004 China wangbo_guet@163.com pankl@guet.edu.cn.
Abstract:
This study employs density functional theory (DFT) to investigate three common free radical scavenging mechanisms (hydrogen atom transfer (HAT), single electron transfer proton transfer (SET-PT), and sequential proton loss electron transfer (SPLET)) in UiO-66-(OH)2 and UiO-66-NH2 metal-organic framework (MOF) nanoparticles under gas, benzene and aqueous phase conditions. The reaction processes between UiO-66-(OH)2/UiO-66-NH2 and hydroxyl radicals (˙OH) were simulated to elucidate detailed radical capture pathways, and the computational results were validated by macroscopic DPPH radical scavenging experiments. The results indicate that: (1) among the three mechanisms, HAT consistently exhibits the lowest bond dissociation energy across all phases, suggesting MOF nanoparticles preferentially undergo hydrogen atom transfer over electron transfer during radical scavenging; (2) compared to gas phase and nonpolar solvent (benzene), polar solvent (water) significantly lowers the energy barriers for both electron transfer and hydrogen transfer, thus enhancing reactivity across all mechanisms; (3) UiO-66-(OH)2 exhibits a radical scavenging rate constant of 1.0 × 109 M-1 s-1, higher than 7.63 × 108 M-1 s-1 for UiO-66-NH2; (4) DPPH assays reveal that UiO-66-(OH)2 exhibits an 8% greater radical scavenging efficiency than UiO-66-NH2, in agreement with DFT predictions and confirming the antioxidative benefit of hydroxyl functionalization. This study proposes a combined DFT and experimental screening workflow for radical scavengers, offering an efficient and economical approach to rapidly identify novel MOF-based radioprotective radical scavengers.


