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Radical regulation and performance retention in functionalized UiO-66/epoxy nanocomposites under γ irradiation
Shuai Ke1,2, Bo Wang1, Ganggang Liu3
1Guangxi Key Laboratory of Advanced Packaging and System Integration, School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology Guilin 541004 China wangbo_guet@163.com pankl@guet.edu.cn.
None:
High-dose γ irradiation induces radical-triggered oxidative chain reactions in epoxy resin (EP), leading to a progressive degradation of its thermo-mechanical properties. Here, EP nanocomposites containing hydroxylated and aminated metal-organic framework (MOF) fillers, UiO-66-(OH)2 and UiO-66-NH2, were prepared to regulate irradiation-induced radical buildup and improve property retention. The composites were evaluated before and after γ irradiation (1 MGy; at a dose rate of 10.8 kGy h-1) using thermogravimetric analysis (TGA) and derivative thermogravimetry (DTG), tensile testing, dynamic mechanical analysis (DMA), and spectroscopic characterizations including electron paramagnetic resonance (EPR), fourier transform infrared spectroscopy (FTIR), and X-ray photoelectron spectroscopy (XPS). Prior to irradiation, both composite systems exhibited an overall strengthening tendency while maintaining ductility. After irradiation, the hydroxylated system showed better property retention. At 1 wt% loading, the tensile strength of UiO-66-(OH)2/EP decreased from 72.41 to 67.09 MPa and the elongation at break from 6.4% to 6.1%, outperforming UiO-66-NH2/EP (72.49 → 64.18 MPa; 6.8% → 5.5%). EPR indicated a pronounced increase in the paramagnetic signal of neat EP after irradiation (I pp, peak-to-peak intensity, under identical settings: 0.174 → 14.23), whereas MOF incorporation attenuated the relative accumulation of paramagnetic centers, with UiO-66-(OH)2/EP showing lower intensity at the same loading (1 wt%: 2.476 vs. 5.650 for UiO-66-NH2/EP). FTIR/XPS revealed substantial buildup of oxygenated species on irradiated EP surfaces (Ox: 10.79% → 41.55%, ΔOx = 30.76). In contrast, 1 wt% UiO-66-(OH)2/EP effectively suppressed oxidative accumulation (ΔOx = 13.53; Ox/C-C = 0.23 after irradiation), lower than UiO-66-NH2/EP (ΔOx = 25.62; Ox/C-C = 0.45). Collectively, functionalized UiO-66 mitigates γ irradiation induced degradation by attenuating the relative accumulation of paramagnetic centers and inhibiting oxidation, thereby enhancing thermo-mechanical retention of EP; hydroxyl functionalization is more effective within a moderate loading window.
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