ResNet-based image processing approach for precise detection of cracks in photovoltaic panels

Montaser Abdelsattar1, Ahmed AbdelMoety2, Ahmed Emad-Eldeen3

  • 1Electrical Engineering Department, Faculty of Engineering, South Valley University, Qena, 83523, Egypt. Montaser.A.Elsattar@eng.svu.edu.eg.

Scientific Reports
|July 8, 2025
PubMed
Summary

A new Deep Learning (DL) method using Residual Network (ResNet) accurately detects cracks in solar Photovoltaic (PV) panels from Electroluminescence (EL) images. ResNet34 offers the best balance of performance and efficiency for PV module maintenance.

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