Related Experiment Video
Updated: Jan 18, 2026

08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
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Correction to "Correlating Carrier Localization to Optoelectronic Behavior of Monolayer MoS2"
ACS Applied Materials & Interfaces
|September 11, 2025
Abstract
No abstract available in PubMed .
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