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Ultimate sensitivity in X-ray diffraction: angular moments versus shot noise

Peter Modregger1,2, Felix Wittwer1,2, Ahmar Khaliq1,2

  • 1Physics Department, University of Siegen, Germany.

Journal of Applied Crystallography
|October 9, 2025
PubMed

Keywords:
Bragg peak analysisX-ray diffractionangular momentsphoton counting detectorsphoton shot noise

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