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Sequential Tilting 4D-STEM for Improved Momentum-Resolved STEM Field Mapping.

Christoph Flathmann^1,2,3, Ulrich Ross¹, Jürgen Belz⁴

¹4th Institute of Physics -Solids and Nanostructures, Georg-August-University Goettingen, Friedrich-Hund-Platz 1, Göttingen 37077, Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

|October 17, 2025

Summary

This summary is machine-generated.

Momentum-resolved scanning transmission electron microscopy (MRSTEM) offers new ways to map magnetic and electric fields. A novel sequential beam tilting method improves data quality and field measurement accuracy without hardware changes.

Keywords:

4D-STEM momentum-resolved scanning transmission electron microscopy precession electron diffraction

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Area of Science:

Materials Science
Condensed Matter Physics
Electron Microscopy

Background:

Momentum-resolved scanning transmission electron microscopy (MRSTEM) is crucial for mapping nanoscale magnetic and electric fields, vital for device functionality.
Measuring these fields is challenging due to their small magnitude compared to atomic fields, making MRSTEM signals sensitive to diffraction conditions.

Purpose of the Study:

To present an alternative data acquisition method for MRSTEM that enhances field measurement accuracy and data quality.
To demonstrate a hardware-free approach that allows for optimized beam tilt patterns and access to additional diffraction information.

Main Methods:

Sequential tilting of the incident electron beam with recording of a full diffraction pattern at each tilt and spatial position.
Generation of virtual large-angle convergent beam electron diffraction patterns from acquired data.
Application of advanced data analysis methods beyond simple averaging for improved field measurements.

Main Results:

The sequential beam tilting method provides access to additional information, enabling virtual large-angle convergent beam electron diffraction pattern creation.
This approach allows for robust assessment of MRSTEM data quality.
Improved accuracy in measuring lateral magnetic and electric fields at the nanoscale.

Conclusions:

The presented sequential beam tilting technique is a versatile, hardware-independent advancement for MRSTEM.
It enhances data analysis capabilities and field measurement precision.
The data acquisition concept is broadly applicable to other 4D-STEM techniques.