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Hyperspectral TERS Imaging Reveals Strain Heterogeneity in Individual Nanoplastic Particles
Anushree Dutta1, Siiri Bienz1, Naresh Kumar1
1Department of Chemistry and Applied Biosciences, ETH Zurich, CH-8093 Zurich, Switzerland.
Nano Letters
|December 12, 2025
Summary
Researchers used atomic force microscopy-based tip-enhanced Raman spectroscopy (AFM-TERS) to chemically characterize individual nanoplastics. This technique revealed nanoscale variations in stiffness and chemical composition within single nanoplastic particles.
Area of Science:
- Environmental Science
- Materials Science
- Analytical Chemistry
Background:
- Nanoplastics present significant environmental and health concerns.
- Label-free, nondestructive detection of single nanoplastic particles is difficult.
Purpose of the Study:
- To develop a method for label-free, nondestructive chemical characterization of individual nanoplastic particles.
- To investigate intraparticle heterogeneity in nanoplastics at the single-particle level.
Main Methods:
- Atomic force microscopy-based tip-enhanced Raman spectroscopy (AFM-TERS) was employed for hyperspectral imaging.
- Characterization was performed on individual polystyrene (PS) nanoplastic particles under ambient conditions.
- Correlative AFM phase imaging was used to assess local stiffness variations.
Main Results:
- AFM-TERS achieved single-particle sensitivity for nanoplastics as small as 32 nm.
- Hyperspectral TERS maps showed significant intraparticle heterogeneity in chemical composition.
- Spectral shifts correlated with nanoscale variations in local stiffness, indicating strain heterogeneity.
Conclusions:
- AFM-TERS enables sensitive, label-free chemical mapping of individual nanoplastics.
- The study demonstrates the capability to detect and analyze intraparticle heterogeneity in nanoplastics.
- This technique offers new avenues for identifying nanoplastics and monitoring their chemical transformations in complex matrices.

