Enhancing STEM Tomography via Generative Interpolation of Tilt Series for Nanoparticle Analysis

Taekyung Kim1, Dong-Wook Lee2, Woonbae Sohn1

  • 1AI-enhanced Electron Microscopy Research Group, Strategic Research Center for Smart Battery, Korea Basic Science Institute (KBSI), Daejeon 34133, Republic of Korea.

Abstract