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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Weiqiang Tang1, Jinwen Liu2, Katharina Doblhoff-Dier2
1Forschungszentrum Jülich GmbH, Institute of Energy Technologies, IET-3: Theory and Computation of Energy Materials, 52425 Jülich, Germany.
Surface roughness on silver electrodes significantly impacts electrical double layers (EDL). Mesoscopic roughness unexpectedly reduces the correlation between work function and potential of zero free charge (PZFC).
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