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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
Theoretical Study of High-Performance Two-Dimensional WO2 MOSFETs with Excellent n/p Symmetry
Tong Xu1, Weicong Sun1, Zuyun Chen2
1The Key Laboratory of Advanced Display Materials and Devices, Ministry of Industry and Information Technology, College of Material Science and Engineering, Nanjing University of Science and Technology, Nanjing210094, China.
Abstract:
As transistor dimensions are scaled down to the sub-10 nm regime, two-dimensional (2D) layered materials have attracted extensive attention for suppressing short-channel effects. Nevertheless, the development of p-type 2D transistors lags far behind that of n-type devices, hindering 2D CMOS technology advancement. Herein, the electronic properties of 2D WO2 and the quantum transport characteristics of dual-gate WO2 MOSFETs are systematically investigated using density functional theory combined with the nonequilibrium Green's function. At 10 nm channel length, the n-type and p-type devices exhibit high on-state current (Ion) of 1615 μA/μm and 1759 μA/μm, respectively, which satisfy the ITRS high-performance requirements with excellent n/p symmetry. It is also found that the large bandwidth of the isolated valence band impedes ultrasteep subthreshold swing. Moreover, WO2 MOSFETs exhibit small delay time (τ) and low power delay product (PDP), providing a theoretical basis for material selection and device design of high-performance sub-10 nm 2D transistors.
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