A simplified mode of differential phase contrast Lorentz microscopy
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Updated: Nov 7, 2026

Phase Contrast and Differential Interference Contrast (DIC) Microscopy
Published on: August 6, 2008
1Department of Physics and Astronomy, Arizona State University, Tempe 85287-1504.
Abstract:
A simplified mode of differential phase contrast Lorentz microscopy for the study of magnetic domain structures in thin films is proposed and demonstrated. This mode employs a single annular detector in a scanning transmission electron microscope rather than the specialized split detectors that have been previously used. The resulting signal is sufficiently linear with magnetic field strength to allow quantitative data to be obtained on the domain configurations and the natures of the domain walls.
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