Comparative evaluation of Wellhöfer ion chamber array and Scanditronix diode array for dynamic wedge dosimetry

Normalised profiles have been measured using the Scanditronix diode array and the Wellhöfer ion chamber array for the Varian dynamic wedge. Agreement was of the order of 0.1% of central axis peak dose for an open beam at depth, 0.3% for a dynamic wedge field at depth, and up to 0.6% at the peak depth. The use of the arrays for data acquisition is discussed, including user interface limitations. Data reproducibility is determined to be of the order of 0.1% for both systems. The issue of beam hardening within dynamic wedges is discussed and resolved in terms of the dose-gradient effect. A method for interpolation between dynamic wedge profiles using open beam data is presented that allows construction of isodoses to an estimated accuracy of 0.7%. Finally a benchmark for comparison of different measuring systems based on quality assurance requirements for the enhanced dynamic wedge is suggested.