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ESEM observation of thermal shock cracking
C E Corbellani1, G Alejandro, R B Topolevsky
1Instituto de Investigaciones Científicas y Técnicas de las Fuerzas Armadas (CITEFA), Provincia de Buenos Aires, República Argentina.
Microscopy Research and Technique
|October 23, 1997
Abstract:
We report a simple method for a quick and efficient localization of thermal shock cracks as narrow as 1 micron or less, using Environmental Scanning Electron Microscopy (ESEM). The non-destructive character of the technique is exploited in order to observe relevant fractographic features of the crack pattern.