A comparative study of the work involved in measuring profiles using an ion chamber, a linear diode array and film

In this work a method of using Kodak X-Omat V film to measure beam profiles for dynamically wedged fields is presented. Also, the profiles determined by film measurement are compared with those measured with an ion chamber (0.12 cm3 Scanditronix RFA 300 RK) and an array of silicon diodes (11 channel Scanditronix linear diode array). The beam investigated is a 6 MV photon beam from a Varian 2100 C linear accelerator. The geometric method of positioning film and determining the central axis (CAX) position of the beam yielded results which agreed to within 1 mm with the software determined position of the CAX. The profiles measured by film agreed well with the ion chamber measured profiles in terms of overall field size, position, penumbral width, height and position of maximum and profile shape between the 20% dose levels. Film profiles deviated most from ion chamber profiles in the post-penumbra regions. Linear diode array (LDA) measured profiles matched ion chamber profiles in the post-penumbra regions, field size and general profile shape. In the region of maximum dose differences in dose of up to 4% were seen along with horizontal shifts of around 2 mm between LDA and ion chamber profiles.