Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

A E Vladár

Showing results (1-10 of 8) with videos related to

Pageof 1
Sort By:
Proceedings of Spie--The International Society for Optical Engineering|July 25, 2017
Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetryJ S Villarrubia, V N Tondare, A E Vladár
Scanning|July 10, 2008
Simulated SEM images for resolution measurementP Cizmar, A E Vladár, B Ming, et al.
Scanning|September 23, 2011
Modeling the point-spread function in helium-ion lithographyDonald Winston, J Ferrera, L Battistella, et al.
Scanning|October 6, 2001
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1--Applications to accurate dimension measurementsM T Postek, A E Vladár, O C Wells, et al.
APL Materials|April 16, 2019
Electron beam-based metrology after CMOSJ A Liddle, B D Hoskins, A E Vladár, et al.
Scanning|January 5, 2002
Application of the low-loss scanning electron microscope image to integrated circuit technology part II--chemically-mechanically planarized samplesO C Wells, M McGlashan-Powell, A E Vladár, et al.
Scanning|September 14, 1999
Image sharpness measurement in the scanning electron-microscope--part IIIN F Zhang, M T Postek, R D Larrabee, et al.
Ultramicroscopy|March 10, 2015
Scanning electron microscope measurement of width and shape of 10nm patterned lines using a JMONSEL-modeled libraryJ S Villarrubia, A E Vladár, B Ming, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Proceedings of Spie--The International Society for Optical Engineering|July 25, 2017
Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetryJ S Villarrubia, V N Tondare, A E Vladár
Scanning|July 10, 2008
Simulated SEM images for resolution measurementP Cizmar, A E Vladár, B Ming, et al.
Scanning|September 23, 2011
Modeling the point-spread function in helium-ion lithographyDonald Winston, J Ferrera, L Battistella, et al.
Scanning|October 6, 2001
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1--Applications to accurate dimension measurementsM T Postek, A E Vladár, O C Wells, et al.
APL Materials|April 16, 2019
Electron beam-based metrology after CMOSJ A Liddle, B D Hoskins, A E Vladár, et al.
Scanning|January 5, 2002
Application of the low-loss scanning electron microscope image to integrated circuit technology part II--chemically-mechanically planarized samplesO C Wells, M McGlashan-Powell, A E Vladár, et al.
Scanning|September 14, 1999
Image sharpness measurement in the scanning electron-microscope--part IIIN F Zhang, M T Postek, R D Larrabee, et al.
Ultramicroscopy|March 10, 2015
Scanning electron microscope measurement of width and shape of 10nm patterned lines using a JMONSEL-modeled libraryJ S Villarrubia, A E Vladár, B Ming, et al.
Pageof 1