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Journal of Electron Microscopy|July 1, 2006
Observations of unstained biological specimens using a low-energy, high-resolution STEMAkio Takaoka, Toshiaki HasegawaJournal of Electron Microscopy|December 8, 2004
Influence of the image quality deterioration of a tilted thick specimen on electron tomographyHai-Bo Zhang, Chao Yang, Akio TakaokaJournal of Electron Microscopy|October 12, 2007
Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscopeHai-Bo Zhang, Fang Wang, Akio TakaokaUltramicroscopy|July 1, 2017
Axial geometrical aberration correction up to 5th order with N-SYLCShahedul Hoque, Hiroyuki Ito, Akio Takaoka, et al.Ultramicroscopy|November 27, 2007
Microscopic tomography with ultra-HVEM and applicationsAkio Takaoka, Toshiaki Hasegawa, Kiyokazu Yoshida, et al.Journal of Electron Microscopy|November 16, 2010
An automatic method of detecting and tracking fiducial markers for alignment in electron tomographyMeng Cao, Akio Takaoka, Hai-Bo Zhang, et al.Acta Histochemica Et Cytochemica|July 27, 2007
Three-dimensional, computer-tomographic analysis of membrane proteins (TrkA, caveolin, clathrin) in PC12 cellsTomoki Nishida, Tatsuo Arii, Akio Takaoka, et al.Ultramicroscopy|December 3, 2015
Spherical aberration correction with threefold symmetric line currentsShahedul Hoque, Hiroyuki Ito, Ryuji Nishi, et al.Journal of Electron Microscopy|August 27, 2005
The top-bottom effect of a tilted thick specimen and its influence on electron tomographyChao Yang, Hai-Bo Zhang, Jing-Jing Li, et al.The Review of Scientific Instruments|May 17, 2007
Tomography experiment of an integrated circuit specimen using 3 MeV electrons in the transmission electron microscopeHai-Bo Zhang, Xiang-Liang Zhang, Yong Wang, et al.Pageof 3