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B Deconihout

Showing results (1-10 of 15) with videos related to

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Physical Review Letters|August 7, 2007
Femtosecond field ion emission by surface optical rectificationA Vella, B Deconihout, L Marrucci, et al.
Ultramicroscopy|December 17, 2010
Evaporation mechanisms of MgO in laser assisted atom probe tomographyB Mazumder, A Vella, B Deconihout, et al.
Ultramicroscopy|January 22, 2003
Improvement of the mass resolution of the atom probe using a dual counter-electrodeB Deconihout, R Saint-Martin, C Jarnot, et al.
Ultramicroscopy|February 13, 2013
A model to predict image formation in Atom probe TomographyF Vurpillot, A Gaillard, G Da Costa, et al.
Ultramicroscopy|April 3, 2007
Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporationM Gilbert, F Vurpillot, A Vella, et al.
Ultramicroscopy|May 8, 2007
Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitterB Gault, A Vella, F Vurpillot, et al.
Ultramicroscopy|November 26, 2008
Three-dimensional atom mapping of boron in implanted siliconO Cojocaru-Mirédin, E Cadel, B Deconihout, et al.
The Review of Scientific Instruments|January 3, 2013
Advance in multi-hit detection and quantization in atom probe tomographyG Da Costa, H Wang, S Duguay, et al.
Ultramicroscopy|January 22, 2003
Effects of incidence angles of ions on the mass resolution of an energy compensated 3D atom probeE Bémont, A Bostel, M Bouet, et al.
Ultramicroscopy|December 9, 2014
Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atomsL Arnoldi, E P Silaeva, F Vurpillot, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Physical Review Letters|August 7, 2007
Femtosecond field ion emission by surface optical rectificationA Vella, B Deconihout, L Marrucci, et al.
Ultramicroscopy|December 17, 2010
Evaporation mechanisms of MgO in laser assisted atom probe tomographyB Mazumder, A Vella, B Deconihout, et al.
Ultramicroscopy|January 22, 2003
Improvement of the mass resolution of the atom probe using a dual counter-electrodeB Deconihout, R Saint-Martin, C Jarnot, et al.
Ultramicroscopy|February 13, 2013
A model to predict image formation in Atom probe TomographyF Vurpillot, A Gaillard, G Da Costa, et al.
Ultramicroscopy|April 3, 2007
Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporationM Gilbert, F Vurpillot, A Vella, et al.
Ultramicroscopy|May 8, 2007
Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitterB Gault, A Vella, F Vurpillot, et al.
Ultramicroscopy|November 26, 2008
Three-dimensional atom mapping of boron in implanted siliconO Cojocaru-Mirédin, E Cadel, B Deconihout, et al.
The Review of Scientific Instruments|January 3, 2013
Advance in multi-hit detection and quantization in atom probe tomographyG Da Costa, H Wang, S Duguay, et al.
Ultramicroscopy|January 22, 2003
Effects of incidence angles of ions on the mass resolution of an energy compensated 3D atom probeE Bémont, A Bostel, M Bouet, et al.
Ultramicroscopy|December 9, 2014
Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atomsL Arnoldi, E P Silaeva, F Vurpillot, et al.
Pageof 2