Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Bert Freitag

Showing results (1-10 of 15) with videos related to

Pageof 2
Sort By:
Ultramicroscopy|March 19, 2016
An alternative approach for ζ-factor measurement using pure element nanoparticlesDaniele Zanaga, Thomas Altantzis, Jonathan Sanctorum, et al.
Ultramicroscopy|July 6, 2014
Advanced double-biprism holography with atomic resolutionFlorian Genz, Tore Niermann, Bart Buijsse, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|August 17, 2011
Atomic resolution imaging using the real-space distribution of electrons scattered by a crystalline materialSorin Lazar, Joanne Etheridge, Christian Dwyer, et al.
Ultramicroscopy|July 9, 2013
Controlling electron beam-induced structure modifications and cation exchange in cadmium sulfide-copper sulfide heterostructured nanorodsHaimei Zheng, Bryce Sadtler, Carsten Habenicht, et al.
Journal of Nanoscience and Nanotechnology|May 16, 2009
Ultra-high resolution nano-characterisation and analysis using advanced S/TEMDominique H W Hubert, Bert Freitag, Debbie J Stokes, et al.
Ultramicroscopy|December 15, 2020
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challengesHans Vanrompay, Alexander Skorikov, Eva Bladt, et al.
Angewandte Chemie (International Ed. in English)|May 31, 2008
Surface chemistry of Ag particles: identification of oxide species by aberration-corrected TEM and by DFT calculationsDang Sheng Su, Timo Jacob, Thomas W Hansen, et al.
Nanomaterials (Basel, Switzerland)|March 29, 2023
Probing the Boundary between Classical and Quantum Mechanics by Analyzing the Energy Dependence of Single-Electron Scattering Events at the NanoscaleChristian Kisielowski, Petra Specht, Stig Helveg, et al.
Ultramicroscopy|May 17, 2013
XEDS STEM tomography for 3D chemical characterization of nanoscale particlesArda Genc, Libor Kovarik, Meng Gu, et al.
Nanoscale|July 2, 2011
High resolution mapping of surface reduction in ceria nanoparticlesStuart Turner, Sorin Lazar, Bert Freitag, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|March 19, 2016
An alternative approach for ζ-factor measurement using pure element nanoparticlesDaniele Zanaga, Thomas Altantzis, Jonathan Sanctorum, et al.
Ultramicroscopy|July 6, 2014
Advanced double-biprism holography with atomic resolutionFlorian Genz, Tore Niermann, Bart Buijsse, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|August 17, 2011
Atomic resolution imaging using the real-space distribution of electrons scattered by a crystalline materialSorin Lazar, Joanne Etheridge, Christian Dwyer, et al.
Ultramicroscopy|July 9, 2013
Controlling electron beam-induced structure modifications and cation exchange in cadmium sulfide-copper sulfide heterostructured nanorodsHaimei Zheng, Bryce Sadtler, Carsten Habenicht, et al.
Journal of Nanoscience and Nanotechnology|May 16, 2009
Ultra-high resolution nano-characterisation and analysis using advanced S/TEMDominique H W Hubert, Bert Freitag, Debbie J Stokes, et al.
Ultramicroscopy|December 15, 2020
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challengesHans Vanrompay, Alexander Skorikov, Eva Bladt, et al.
Angewandte Chemie (International Ed. in English)|May 31, 2008
Surface chemistry of Ag particles: identification of oxide species by aberration-corrected TEM and by DFT calculationsDang Sheng Su, Timo Jacob, Thomas W Hansen, et al.
Nanomaterials (Basel, Switzerland)|March 29, 2023
Probing the Boundary between Classical and Quantum Mechanics by Analyzing the Energy Dependence of Single-Electron Scattering Events at the NanoscaleChristian Kisielowski, Petra Specht, Stig Helveg, et al.
Ultramicroscopy|May 17, 2013
XEDS STEM tomography for 3D chemical characterization of nanoscale particlesArda Genc, Libor Kovarik, Meng Gu, et al.
Nanoscale|July 2, 2011
High resolution mapping of surface reduction in ceria nanoparticlesStuart Turner, Sorin Lazar, Bert Freitag, et al.
Pageof 2