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Bing-Feng Ju

Showing results (1-10 of 36) with videos related to

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The Review of Scientific Instruments|April 3, 2012
Fast scanning mode and its realization in a scanning acoustic microscopeBing-Feng Ju, Xiaolong Bai, Jian Chen
The Review of Scientific Instruments|April 3, 2015
A new method for evaluating the degeneration of articular cartilage using pulse-echo ultrasoundAnyu Sun, Xiaolong Bai, Bing-Feng Ju
The Review of Scientific Instruments|March 3, 2017
Deconvolution imaging of weak reflective pipe defects using guided-wave signals captured by a scanning receiverZeqing Sun, Anyu Sun, Bing-Feng Ju
The Review of Scientific Instruments|January 7, 2014
Note: Symmetric modulation methodology applied in improving the performance of scanning tunneling microscopyBing-Feng Ju, Wu-Le Zhu, Wei Zhang
The Review of Scientific Instruments|February 2, 2011
The art of electrochemical etching for preparing tungsten probes with controllable tip profile and characteristic parametersBing-Feng Ju, Yuan-Liu Chen, Yaozheng Ge
Scanning|March 20, 2013
Design of optimal fast scanning trajectory for the mechanical scanner of measurement instrumentsBing-Feng Ju, Xiaolong Bai, Jian Chen, et al.
Ultrasonics|May 21, 2013
An ultrasonic methodology for determining the mechanical and geometrical properties of a thin layer using a deconvolution techniqueJian Chen, Xiaolong Bai, Keji Yang, et al.
The Review of Scientific Instruments|February 4, 2012
Angular measurement of acoustic reflection coefficients by the inversion of V(z, t) data with high frequency time-resolved acoustic microscopyJian Chen, Xiaolong Bai, Keji Yang, et al.
The Review of Scientific Instruments|February 4, 2012
A contactless methodology of picking up micro-particles from rigid surfaces by acoustic radiation forceKun Jia, Keji Yang, Zongwei Fan, et al.
Ultrasonics|December 3, 2014
Simultaneously measuring thickness, density, velocity and attenuation of thin layers using V(z,t) data from time-resolved acoustic microscopyJian Chen, Xiaolong Bai, Keji Yang, et al.
Pageof 4

Showing results (1-10 of 36) with videos related to

Sort By:
Pageof 4
The Review of Scientific Instruments|April 3, 2012
Fast scanning mode and its realization in a scanning acoustic microscopeBing-Feng Ju, Xiaolong Bai, Jian Chen
The Review of Scientific Instruments|April 3, 2015
A new method for evaluating the degeneration of articular cartilage using pulse-echo ultrasoundAnyu Sun, Xiaolong Bai, Bing-Feng Ju
The Review of Scientific Instruments|March 3, 2017
Deconvolution imaging of weak reflective pipe defects using guided-wave signals captured by a scanning receiverZeqing Sun, Anyu Sun, Bing-Feng Ju
The Review of Scientific Instruments|January 7, 2014
Note: Symmetric modulation methodology applied in improving the performance of scanning tunneling microscopyBing-Feng Ju, Wu-Le Zhu, Wei Zhang
The Review of Scientific Instruments|February 2, 2011
The art of electrochemical etching for preparing tungsten probes with controllable tip profile and characteristic parametersBing-Feng Ju, Yuan-Liu Chen, Yaozheng Ge
Scanning|March 20, 2013
Design of optimal fast scanning trajectory for the mechanical scanner of measurement instrumentsBing-Feng Ju, Xiaolong Bai, Jian Chen, et al.
Ultrasonics|May 21, 2013
An ultrasonic methodology for determining the mechanical and geometrical properties of a thin layer using a deconvolution techniqueJian Chen, Xiaolong Bai, Keji Yang, et al.
The Review of Scientific Instruments|February 4, 2012
Angular measurement of acoustic reflection coefficients by the inversion of V(z, t) data with high frequency time-resolved acoustic microscopyJian Chen, Xiaolong Bai, Keji Yang, et al.
The Review of Scientific Instruments|February 4, 2012
A contactless methodology of picking up micro-particles from rigid surfaces by acoustic radiation forceKun Jia, Keji Yang, Zongwei Fan, et al.
Ultrasonics|December 3, 2014
Simultaneously measuring thickness, density, velocity and attenuation of thin layers using V(z,t) data from time-resolved acoustic microscopyJian Chen, Xiaolong Bai, Keji Yang, et al.
Pageof 4