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Applied Optics|February 4, 2010
White light extended source shearing interferometerJ C Wyant
Applied Optics|February 4, 2010
Double frequency grating lateral shear interferometerJ C Wyant
Applied Optics|March 25, 2010
Use of a symbolic math system to solve polarized light problemsJ C Wyant
Optics Letters|August 28, 2009
High-gain holographic screensE Eichen, J C Wyant
Applied Optics|August 21, 2010
Testing spherical surfaces: a fast, quasi-absolute techniqueK Creath, J C Wyant
Applied Optics|June 23, 2010
Absolute measurement of surface roughnessK Creath, J C Wyant
Applied Optics|March 18, 2008
Fringe modulation skewing effect in white-light vertical scanning interferometryA Harasaki, J C Wyant
Applied Optics|February 6, 2010
Evaluation of large aberrations using a lateral-shear interferometer having variable shearM P Rimmer, J C Wyant
Applied Optics|February 19, 2010
Real-time optical subtraction of photographic imagery for difference detectionJ F Ebersole, J C Wyant
Applied Optics|January 16, 2010
Undesired light in a reconstructed hologram image caused by the nonlinearity of the photographic processJ C Wyant, M P Givens
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