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Scientific Reports
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March 15, 2024
Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction
Sangwon Lee, Tracy D Berman, Can Yildirim, et al.
Optics Express
|
February 25, 2022
Fourier ptychographic dark field x-ray microscopy
Mads Carlsen, Trygve M Ræder, Can Yildirim, et al.
Optics Express
|
May 4, 2016
Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry
Frieder J Koch, Carsten Detlefs, Tobias J Schröter, et al.
Journal of Applied Crystallography
|
April 10, 2024
Simulations of dislocation contrast in dark-field X-ray microscopy
Sina Borgi, Trygve Magnus Ræder, Mads Allerup Carlsen, et al.
Journal of Synchrotron Radiation
|
January 5, 2021
Design simulations of a horizontally deflecting high-heat-load monochromator
Philipp Brumund, Juan Reyes-Herrera, Carsten Detlefs, et al.
Optics Express
|
March 2, 2023
Tilting refractive x-ray lenses for fine-tuning of their focal length
Rafael Celestre, Thomas Roth, Carsten Detlefs, et al.
Physical Review Letters
|
September 28, 2010
Strong K-edge magnetic circular dichroism observed in photon-in-photon-out spectroscopy
Marcin Sikora, Amélie Juhin, Tsu-Chien Weng, et al.
Scientific Reports
|
March 7, 2023
Extensive 3D mapping of dislocation structures in bulk aluminum
Can Yildirim, Henning F Poulsen, Grethe Winther, et al.
Journal of Synchrotron Radiation
|
June 15, 2013
Thermal deformation of cryogenically cooled silicon crystals under intense X-ray beams: measurement and finite-element predictions of the surface shape
Lin Zhang, Manuel Sánchez Del Río, Giulio Monaco, et al.
Journal of Synchrotron Radiation
|
October 22, 2009
Linear polarization scans for resonant X-ray diffraction with a double-phase-plate configuration
Valerio Scagnoli, Claudio Mazzoli, Carsten Detlefs, et al.
Page
of 4
Search research articles
Search
Showing results (11-20 of 39) with videos related to
Sort By:
Page
of 4
Scientific Reports
|
March 15, 2024
Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction
Sangwon Lee, Tracy D Berman, Can Yildirim, et al.
Optics Express
|
February 25, 2022
Fourier ptychographic dark field x-ray microscopy
Mads Carlsen, Trygve M Ræder, Can Yildirim, et al.
Optics Express
|
May 4, 2016
Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry
Frieder J Koch, Carsten Detlefs, Tobias J Schröter, et al.
Journal of Applied Crystallography
|
April 10, 2024
Simulations of dislocation contrast in dark-field X-ray microscopy
Sina Borgi, Trygve Magnus Ræder, Mads Allerup Carlsen, et al.
Journal of Synchrotron Radiation
|
January 5, 2021
Design simulations of a horizontally deflecting high-heat-load monochromator
Philipp Brumund, Juan Reyes-Herrera, Carsten Detlefs, et al.
Optics Express
|
March 2, 2023
Tilting refractive x-ray lenses for fine-tuning of their focal length
Rafael Celestre, Thomas Roth, Carsten Detlefs, et al.
Physical Review Letters
|
September 28, 2010
Strong K-edge magnetic circular dichroism observed in photon-in-photon-out spectroscopy
Marcin Sikora, Amélie Juhin, Tsu-Chien Weng, et al.
Scientific Reports
|
March 7, 2023
Extensive 3D mapping of dislocation structures in bulk aluminum
Can Yildirim, Henning F Poulsen, Grethe Winther, et al.
Journal of Synchrotron Radiation
|
June 15, 2013
Thermal deformation of cryogenically cooled silicon crystals under intense X-ray beams: measurement and finite-element predictions of the surface shape
Lin Zhang, Manuel Sánchez Del Río, Giulio Monaco, et al.
Journal of Synchrotron Radiation
|
October 22, 2009
Linear polarization scans for resonant X-ray diffraction with a double-phase-plate configuration
Valerio Scagnoli, Claudio Mazzoli, Carsten Detlefs, et al.
Page
of 4