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Optics Letters|April 19, 2013
Reflection coefficient monitoring for optical interference coating depositionsCheng-Chung Lee, Kai Wu, Meng-Yen HoOptics Letters|August 3, 2007
In situ sensitive optical monitoring with proper error compensationCheng-Chung Lee, Kai WuOptics Express|March 16, 2012
Advanced broadband monitoring for thin film deposition through equivalent optical admittance loci observationKai Wu, Cheng-Chung Lee, Tzu-Ling NiOptics Letters|August 18, 2011
Multilayer thin-film inspection through measurements of reflection coefficientsKai Wu, Cheng-Chung Lee, Neal J Brock, et al.Optics Express|June 25, 2009
Optical monitoring and real time admittance loci calculation through polarization interferometerCheng-Chung Lee, Kai Wu, Sheng-Hui Chen, et al.Optics Express|June 6, 2009
Improvement of the optical coating process by cutting layers with sensitive monitoring wavelengthsCheng-Chung Lee, Kai Wu, Chien-Cheng Kuo, et al.Applied Optics|January 8, 2013
Optical interference coatings for optics and photonics [Invited]Cheng-Chung LeeOptics Express|April 20, 2011
Antireflection coatings for deep ultraviolet optics deposited by magnetron sputtering from Al targetsBo-Huei Liao, Cheng-Chung LeeApplied Optics|February 12, 2014
Structural color mechanism in the Papilio blumei butterflyMei-Ling Lo, Cheng-Chung LeeApplied Optics|April 7, 2007
Simulation of intensity of a patterned thin-film structureYa-Ping Li, Cheng-Chung LeePageof 196