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Claude Amra

Showing results (11-20 of 63) with videos related to

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Applied Optics|February 12, 2014
Spatially resolved surface topography retrieved from far-field intensity scattering measurementsMyriam Zerrad, Michel Lequime, Claude Amra
Applied Optics|June 18, 2002
Angle-resolved ellipsometry of light scattering: discrimination of surface and bulk effects in substrates and optical coatingsCarole Deumié, Hugues Giovannini, Claude Amra
Applied Optics|April 5, 2011
Optical component interface scatter characterization by selective polarization extinctionGaëlle Georges, Carole Deumié, Claude Amra
Optics Express|June 24, 2009
Selective probing and imaging in random media based on the elimination of polarized scatteringGaëlle Georges, Carole Deumié, Claude Amra
Optics Express|June 5, 2009
Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulksOlivier Gilbert, Carole Deumié, Claude Amra
Applied Optics|May 15, 2002
Index determination of opaque and semitransparent metallic films: application to light absorbersMichel Cathelinaud, Frédéric Lemarquis, Claude Amra
Optics Letters|June 5, 2012
Coherence and polarization properties in speckle of totally depolarized light scattered by totally depolarizing mediaPhilippe Réfrégier, Myriam Zerrad, Claude Amra
Optics Letters|May 2, 2020
Wide-range wavelength and angle resolved light scattering measurement setupMarin Fouchier, Myriam Zerrad, Michel Lequime, et al.
Optics Express|October 20, 2015
Ultra-wide-range measurements of thin-film filter optical density over the visible and near-infrared spectrumMichel Lequime, Simona Liukaityte, Myriam Zerrad, et al.
Optics Express|April 27, 2022
Micro-cavity optimization for ultra-sensitive all-dielectric optical sensorsPaul Rouquette, Claude Amra, Myriam Zerrad, et al.
Pageof 7

Showing results (11-20 of 63) with videos related to

Sort By:
Pageof 7
Applied Optics|February 12, 2014
Spatially resolved surface topography retrieved from far-field intensity scattering measurementsMyriam Zerrad, Michel Lequime, Claude Amra
Applied Optics|June 18, 2002
Angle-resolved ellipsometry of light scattering: discrimination of surface and bulk effects in substrates and optical coatingsCarole Deumié, Hugues Giovannini, Claude Amra
Applied Optics|April 5, 2011
Optical component interface scatter characterization by selective polarization extinctionGaëlle Georges, Carole Deumié, Claude Amra
Optics Express|June 24, 2009
Selective probing and imaging in random media based on the elimination of polarized scatteringGaëlle Georges, Carole Deumié, Claude Amra
Optics Express|June 5, 2009
Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulksOlivier Gilbert, Carole Deumié, Claude Amra
Applied Optics|May 15, 2002
Index determination of opaque and semitransparent metallic films: application to light absorbersMichel Cathelinaud, Frédéric Lemarquis, Claude Amra
Optics Letters|June 5, 2012
Coherence and polarization properties in speckle of totally depolarized light scattered by totally depolarizing mediaPhilippe Réfrégier, Myriam Zerrad, Claude Amra
Optics Letters|May 2, 2020
Wide-range wavelength and angle resolved light scattering measurement setupMarin Fouchier, Myriam Zerrad, Michel Lequime, et al.
Optics Express|October 20, 2015
Ultra-wide-range measurements of thin-film filter optical density over the visible and near-infrared spectrumMichel Lequime, Simona Liukaityte, Myriam Zerrad, et al.
Optics Express|April 27, 2022
Micro-cavity optimization for ultra-sensitive all-dielectric optical sensorsPaul Rouquette, Claude Amra, Myriam Zerrad, et al.
Pageof 7