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D Blavette

Showing results (11-20 of 27) with videos related to

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Ultramicroscopy|May 12, 2007
Standard deviations of composition measurements in atom probe analyses. Part I conventional 1D atom probeF Danoix, G Grancher, A Bostel, et al.
Ultramicroscopy|January 5, 2002
A model accounting for spatial overlaps in 3D atom-probe microscopyD Blavette, F Vurpillot, P Pareige, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2004
Modeling image distortions in 3DAPF Vurpillot, A Cerezo, D Blavette, et al.
Journal of Microscopy|June 29, 2010
Clustering and nearest neighbour distances in atom probe tomography: the influence of the interfacesT Philippe, O Cojocaru-Mirédin, S Duguay, et al.
Ultramicroscopy|December 15, 2012
Point process statistics in atom probe tomographyT Philippe, S Duguay, G Grancher, et al.
Journal of Microscopy|September 14, 2001
Structural analyses in three-dimensional atom probe: a Fourier transform approachF Vurpillot, G Da Costa, A Menand, et al.
Ultramicroscopy|November 26, 2008
Three-dimensional atom mapping of boron in implanted siliconO Cojocaru-Mirédin, E Cadel, B Deconihout, et al.
Ultramicroscopy|October 31, 2020
Atom probe tomography quantification of carbon in siliconP Dumas, S Duguay, J Borrel, et al.
Journal of Microscopy|November 30, 2004
Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probeF Vurpillot, F De Geuser, G Da Costa, et al.
Ultramicroscopy|May 8, 2007
Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitterB Gault, A Vella, F Vurpillot, et al.
Pageof 3

Showing results (11-20 of 27) with videos related to

Sort By:
Pageof 3
Ultramicroscopy|May 12, 2007
Standard deviations of composition measurements in atom probe analyses. Part I conventional 1D atom probeF Danoix, G Grancher, A Bostel, et al.
Ultramicroscopy|January 5, 2002
A model accounting for spatial overlaps in 3D atom-probe microscopyD Blavette, F Vurpillot, P Pareige, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2004
Modeling image distortions in 3DAPF Vurpillot, A Cerezo, D Blavette, et al.
Journal of Microscopy|June 29, 2010
Clustering and nearest neighbour distances in atom probe tomography: the influence of the interfacesT Philippe, O Cojocaru-Mirédin, S Duguay, et al.
Ultramicroscopy|December 15, 2012
Point process statistics in atom probe tomographyT Philippe, S Duguay, G Grancher, et al.
Journal of Microscopy|September 14, 2001
Structural analyses in three-dimensional atom probe: a Fourier transform approachF Vurpillot, G Da Costa, A Menand, et al.
Ultramicroscopy|November 26, 2008
Three-dimensional atom mapping of boron in implanted siliconO Cojocaru-Mirédin, E Cadel, B Deconihout, et al.
Ultramicroscopy|October 31, 2020
Atom probe tomography quantification of carbon in siliconP Dumas, S Duguay, J Borrel, et al.
Journal of Microscopy|November 30, 2004
Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probeF Vurpillot, F De Geuser, G Da Costa, et al.
Ultramicroscopy|May 8, 2007
Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitterB Gault, A Vella, F Vurpillot, et al.
Pageof 3