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D E Aspnes

Showing results (1-10 of 18) with videos related to

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Applied Optics|January 16, 2010
Comments on the determination of the absolute alignment of a polarizerD E Aspnes
Journal of the Optical Society of America|October 1, 1980
Approximate solution of ellipsometric equations for optically biaxial crystalsD E Aspnes
Applied Optics|April 17, 2010
Imaging performance of mirror pairs for grazing-incidence applications: a comparisonD E Aspnes
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 10, 2004
Optimizing precision of rotating-analyzer and rotating-compensator ellipsometersD E Aspnes
Applied Optics|February 16, 2010
Precision bounds to ellipsometer systemsD E Aspnes
Applied Optics|January 30, 2010
Alignment of an optically active biplate compensatorD E Aspnes
Applied Optics|October 14, 2010
Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometersT Yasuda, D E Aspnes
Applied Optics|January 23, 2010
Geometrically exact ellipsometer alignmentD E Aspnes, A A Studna
Applied Optics|April 15, 1986
Multiple determination of the optical constants of thin-film coating materials: a Rh sequelD E Aspnes, H G Craighead
Applied Optics|February 6, 2010
High precision scanning ellipsometerD E Aspnes, A A Studna
Pageof 2

Showing results (1-10 of 18) with videos related to

Sort By:
Pageof 2
Applied Optics|January 16, 2010
Comments on the determination of the absolute alignment of a polarizerD E Aspnes
Journal of the Optical Society of America|October 1, 1980
Approximate solution of ellipsometric equations for optically biaxial crystalsD E Aspnes
Applied Optics|April 17, 2010
Imaging performance of mirror pairs for grazing-incidence applications: a comparisonD E Aspnes
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 10, 2004
Optimizing precision of rotating-analyzer and rotating-compensator ellipsometersD E Aspnes
Applied Optics|February 16, 2010
Precision bounds to ellipsometer systemsD E Aspnes
Applied Optics|January 30, 2010
Alignment of an optically active biplate compensatorD E Aspnes
Applied Optics|October 14, 2010
Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometersT Yasuda, D E Aspnes
Applied Optics|January 23, 2010
Geometrically exact ellipsometer alignmentD E Aspnes, A A Studna
Applied Optics|April 15, 1986
Multiple determination of the optical constants of thin-film coating materials: a Rh sequelD E Aspnes, H G Craighead
Applied Optics|February 6, 2010
High precision scanning ellipsometerD E Aspnes, A A Studna
Pageof 2