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Eric G T Bosch

Showing results (1-10 of 10) with videos related to

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Ultramicroscopy|May 23, 2015
Analysis of HR-STEM theory for thin specimenEric G T Bosch, Ivan Lazić
Ultramicroscopy|September 7, 2019
Analysis of depth-sectioning STEM for thick samples and 3D imagingEric G T Bosch, Ivan Lazić
Scientific Reports|February 10, 2018
Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolutionEmrah Yücelen, Ivan Lazić, Eric G T Bosch
Ultramicroscopy|November 23, 2015
Phase contrast STEM for thin samples: Integrated differential phase contrastIvan Lazić, Eric G T Bosch, Sorin Lazar
Journal of Microscopy|February 14, 2024
Differential phase contrast (DPC) mapping electric fields: Optimising experimental conditionsChen Li, Xiaoke Mu, Maxim Korytov, et al.
Nanoscale|December 8, 2021
Imaging atomic motion of light elements in 2D materials with 30 kV electron microscopySytze de Graaf, Majid Ahmadi, Ivan Lazić, et al.
Ultramicroscopy|August 3, 2025
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrastJanghyun Jo, Ivan Lazić, Eric G T Bosch, et al.
Nature|July 13, 2022
Atomic imaging of zeolite-confined single molecules by electron microscopyBoyuan Shen, Huiqiu Wang, Hao Xiong, et al.
Nature|April 22, 2021
A single-molecule van der Waals compassBoyuan Shen, Xiao Chen, Huiqiu Wang, et al.
Nature Methods|September 6, 2022
Single-particle cryo-EM structures from iDPC-STEM at near-atomic resolutionIvan Lazić, Maarten Wirix, Max Leo Leidl, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|May 23, 2015
Analysis of HR-STEM theory for thin specimenEric G T Bosch, Ivan Lazić
Ultramicroscopy|September 7, 2019
Analysis of depth-sectioning STEM for thick samples and 3D imagingEric G T Bosch, Ivan Lazić
Scientific Reports|February 10, 2018
Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolutionEmrah Yücelen, Ivan Lazić, Eric G T Bosch
Ultramicroscopy|November 23, 2015
Phase contrast STEM for thin samples: Integrated differential phase contrastIvan Lazić, Eric G T Bosch, Sorin Lazar
Journal of Microscopy|February 14, 2024
Differential phase contrast (DPC) mapping electric fields: Optimising experimental conditionsChen Li, Xiaoke Mu, Maxim Korytov, et al.
Nanoscale|December 8, 2021
Imaging atomic motion of light elements in 2D materials with 30 kV electron microscopySytze de Graaf, Majid Ahmadi, Ivan Lazić, et al.
Ultramicroscopy|August 3, 2025
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrastJanghyun Jo, Ivan Lazić, Eric G T Bosch, et al.
Nature|July 13, 2022
Atomic imaging of zeolite-confined single molecules by electron microscopyBoyuan Shen, Huiqiu Wang, Hao Xiong, et al.
Nature|April 22, 2021
A single-molecule van der Waals compassBoyuan Shen, Xiao Chen, Huiqiu Wang, et al.
Nature Methods|September 6, 2022
Single-particle cryo-EM structures from iDPC-STEM at near-atomic resolutionIvan Lazić, Maarten Wirix, Max Leo Leidl, et al.
Pageof 1