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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 5, 2013
Annular dark-field transmission electron microscopy for low contrast materialsF Leroux, E Bladt, J-P Timmermans, et al.Nano Letters|November 25, 2010
Measuring porosity at the nanoscale by quantitative electron tomographyE Biermans, L Molina, K J Batenburg, et al.Ultramicroscopy|August 26, 2011
Exploring different inelastic projection mechanisms for electron tomographyB Goris, S Bals, W Van den Broek, et al.Ultramicroscopy|December 27, 2008
Effect of amorphous layers on the interpretation of restored exit wavesS Van Aert, L Y Chang, S Bals, et al.Ultramicroscopy|June 16, 2009
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopyS Van Aert, J Verbeeck, R Erni, et al.Journal of Electron Microscopy Technique|March 1, 1988
Defect structure of superconducting YBa2Cu3O7-deltaG Van Tendeloo, S AmelinckxJournal of Electron Microscopy Technique|January 1, 1991
Real space modulation in Bi2Sr2CanCun + 1O6+2n and Tl2Ba2CuO6 superconductors derived from electron diffraction informationM Verwerft, G Van TendelooInvestigative Radiology|July 1, 1982
Metacarpal bone mass and upper-extremity strength in 18-year-old boysJ Dequeker, G Van TendelooScience (New York, N.Y.)|December 23, 1988
Dynamics of a Second-Order Phase Transition: P macr; to I1 Phase Transition in Anorthite, CaAl2Si2O8S Ghose, G Van Tendeloo, S AmelinckxNature Communications|June 14, 2012
Atomic scale dynamics of ultrasmall germanium clustersS Bals, S Van Aert, C P Romero, et al.Pageof 22