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H Ade

Showing results (11-20 of 18) with videos related to

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Physical Review Letters|February 21, 2006
Substrate effect on the melting temperature of thin polyethylene filmsY Wang, M Rafailovich, J Sokolov, et al.
Nature Materials|April 17, 2012
Polarized X-ray scattering reveals non-crystalline orientational ordering in organic filmsB A Collins, J E Cochran, H Yan, et al.
The Review of Scientific Instruments|December 3, 2008
PolLux: a new facility for soft x-ray spectromicroscopy at the Swiss Light SourceJ Raabe, G Tzvetkov, U Flechsig, et al.
Ultramicroscopy|June 8, 2001
Optimization of scanning transmission X-ray microscopy for the identification and quantitation of reinforcing particles in polyurethanesA P Hitchcock, I Koprinarov, T Tyliszczak, et al.
Journal of Synchrotron Radiation|February 28, 2003
Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light SourceA L D Kilcoyne, T Tyliszczak, W F Steele, et al.
Journal of X-Ray Science and Technology|February 11, 2011
Coherent Radiation for X-Ray Imaging-The Soft X-Ray Undulator and the X1A Beamline at the NSLSH Rarback, C Buckley, H Ade, et al.
Journal of Synchrotron Radiation|April 13, 2006
Illumination for coherent soft X-ray applications: the new X1A beamline at the NSLSB Winn, H Ade, C Buckley, et al.
Journal of Synchrotron Radiation|July 21, 2004
Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light SourceT Warwick, H Ade, S Cerasari, et al.
Pageof 2

Showing results (11-20 of 18) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 18 results.
Physical Review Letters|February 21, 2006
Substrate effect on the melting temperature of thin polyethylene filmsY Wang, M Rafailovich, J Sokolov, et al.
Nature Materials|April 17, 2012
Polarized X-ray scattering reveals non-crystalline orientational ordering in organic filmsB A Collins, J E Cochran, H Yan, et al.
The Review of Scientific Instruments|December 3, 2008
PolLux: a new facility for soft x-ray spectromicroscopy at the Swiss Light SourceJ Raabe, G Tzvetkov, U Flechsig, et al.
Ultramicroscopy|June 8, 2001
Optimization of scanning transmission X-ray microscopy for the identification and quantitation of reinforcing particles in polyurethanesA P Hitchcock, I Koprinarov, T Tyliszczak, et al.
Journal of Synchrotron Radiation|February 28, 2003
Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light SourceA L D Kilcoyne, T Tyliszczak, W F Steele, et al.
Journal of X-Ray Science and Technology|February 11, 2011
Coherent Radiation for X-Ray Imaging-The Soft X-Ray Undulator and the X1A Beamline at the NSLSH Rarback, C Buckley, H Ade, et al.
Journal of Synchrotron Radiation|April 13, 2006
Illumination for coherent soft X-ray applications: the new X1A beamline at the NSLSB Winn, H Ade, C Buckley, et al.
Journal of Synchrotron Radiation|July 21, 2004
Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light SourceT Warwick, H Ade, S Cerasari, et al.
Pageof 2