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Micromachines
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August 26, 2022
On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET
Jonghyeon Ha, Gyeongyeop Lee, Hagyoul Bae, et al.
Micromachines
|
June 24, 2022
Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors
Gyeongyeop Lee, Jonghyeon Ha, Kihyun Kim, et al.
ACS Applied Materials & Interfaces
|
January 12, 2018
Localized Electrothermal Annealing with Nanowatt Power for a Silicon Nanowire Field-Effect Transistor
Jun-Young Park, Byung-Hyun Lee, Geon-Beom Lee, et al.
Nanotechnology
|
December 1, 2021
First demonstration of robust tri-gate<i>β</i>-Ga<sub>2</sub>O<sub>3</sub>nano-membrane field-effect transistors
Hagyoul Bae, Tae Joon Park, Jinhyun Noh, et al.
Micromachines
|
August 27, 2021
Gateless and Capacitorless Germanium Biristor with a Vertical Pillar Structure
Hagyoul Bae, Geon-Beom Lee, Jae Hur, et al.
ACS Sensors
|
June 15, 2019
Nanoscale FET-Based Transduction toward Sensitive Extended-Gate Biosensors
Jae Kwon, Byung-Hyun Lee, Seong-Yeon Kim, et al.
Scientific Reports
|
October 10, 2018
On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments
Jun-Young Park, Weon-Guk Kim, Hagyoul Bae, et al.
ACS Applied Materials & Interfaces
|
June 22, 2026
Dynamic Probing of Neutron-Induced Reliability Degradation in MoS<sub>2</sub> and WS<sub>2</sub> Transistors
SeungYong Back, Jaewook Yoo, Gi Dan Shim, et al.
ACS Applied Materials & Interfaces
|
August 31, 2024
Compositionally Graded MoS<sub>2</sub>Te<sub>2(1-</sub>/MoS<sub>2</sub> van der Waals Heterostructures for Ultrathin Photovoltaic Applications
Dong Hyun Seo, Guen Hyung Oh, Jong Min Song, et al.
Scientific Reports
|
January 24, 2024
Simulational investigation of self-aligned bilayer linear grating enabling highly enhanced responsivity of MWIR InAs/GaSb type-II superlattice (T2SL) photodetector
Minseok Lee, Zahyun Ku, Seungjin Jeong, et al.
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of 4
Search research articles
Search
Showing results (1-10 of 31) with videos related to
Sort By:
Page
of 4
Micromachines
|
August 26, 2022
On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET
Jonghyeon Ha, Gyeongyeop Lee, Hagyoul Bae, et al.
Micromachines
|
June 24, 2022
Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors
Gyeongyeop Lee, Jonghyeon Ha, Kihyun Kim, et al.
ACS Applied Materials & Interfaces
|
January 12, 2018
Localized Electrothermal Annealing with Nanowatt Power for a Silicon Nanowire Field-Effect Transistor
Jun-Young Park, Byung-Hyun Lee, Geon-Beom Lee, et al.
Nanotechnology
|
December 1, 2021
First demonstration of robust tri-gate<i>β</i>-Ga<sub>2</sub>O<sub>3</sub>nano-membrane field-effect transistors
Hagyoul Bae, Tae Joon Park, Jinhyun Noh, et al.
Micromachines
|
August 27, 2021
Gateless and Capacitorless Germanium Biristor with a Vertical Pillar Structure
Hagyoul Bae, Geon-Beom Lee, Jae Hur, et al.
ACS Sensors
|
June 15, 2019
Nanoscale FET-Based Transduction toward Sensitive Extended-Gate Biosensors
Jae Kwon, Byung-Hyun Lee, Seong-Yeon Kim, et al.
Scientific Reports
|
October 10, 2018
On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments
Jun-Young Park, Weon-Guk Kim, Hagyoul Bae, et al.
ACS Applied Materials & Interfaces
|
June 22, 2026
Dynamic Probing of Neutron-Induced Reliability Degradation in MoS<sub>2</sub> and WS<sub>2</sub> Transistors
SeungYong Back, Jaewook Yoo, Gi Dan Shim, et al.
ACS Applied Materials & Interfaces
|
August 31, 2024
Compositionally Graded MoS<sub>2</sub>Te<sub>2(1-</sub>/MoS<sub>2</sub> van der Waals Heterostructures for Ultrathin Photovoltaic Applications
Dong Hyun Seo, Guen Hyung Oh, Jong Min Song, et al.
Scientific Reports
|
January 24, 2024
Simulational investigation of self-aligned bilayer linear grating enabling highly enhanced responsivity of MWIR InAs/GaSb type-II superlattice (T2SL) photodetector
Minseok Lee, Zahyun Ku, Seungjin Jeong, et al.
Page
of 4