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Huolin L Xin

Showing results (1-10 of 148) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 27, 2012
On-column 2p bound state with topological charge ±1 excited by an atomic-size vortex beam in an aberration-corrected scanning transmission electron microscopeHuolin L Xin, Haimei Zheng
Nano Letters|February 9, 2012
In situ observation of oscillatory growth of bismuth nanoparticlesHuolin L Xin, Haimei Zheng
Nature Nanotechnology|November 5, 2010
Electron microscopy: a new spin on electron beamsHuolin L Xin, David A Muller
Journal of Electron Microscopy|January 24, 2009
Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEMHuolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2010
Three-dimensional imaging in aberration-corrected electron microscopesHuolin L Xin, David A Muller
Scientific Reports|August 29, 2023
MnEdgeNet for accurate decomposition of mixed oxidation states for Mn XAS and EELS L2,3 edges without reference and calibrationZhengran Ji, Mike Hu, Huolin L Xin
Scientific Reports|December 23, 2022
Electron energy loss spectroscopy database synthesis and automation of core-loss edge recognition by deep-learning neural networksLingli Kong, Zhengran Ji, Huolin L Xin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 3, 2010
Extended depth of field for high-resolution scanning transmission electron microscopyRobert Hovden, Huolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2012
Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEMHuolin L Xin, Ye Zhu, David A Muller
Ultramicroscopy|August 2, 2008
Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopesVarat Intaraprasonk, Huolin L Xin, David A Muller
Pageof 15

Showing results (1-10 of 148) with videos related to

Sort By:
Pageof 15
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 27, 2012
On-column 2p bound state with topological charge ±1 excited by an atomic-size vortex beam in an aberration-corrected scanning transmission electron microscopeHuolin L Xin, Haimei Zheng
Nano Letters|February 9, 2012
In situ observation of oscillatory growth of bismuth nanoparticlesHuolin L Xin, Haimei Zheng
Nature Nanotechnology|November 5, 2010
Electron microscopy: a new spin on electron beamsHuolin L Xin, David A Muller
Journal of Electron Microscopy|January 24, 2009
Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEMHuolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 23, 2010
Three-dimensional imaging in aberration-corrected electron microscopesHuolin L Xin, David A Muller
Scientific Reports|August 29, 2023
MnEdgeNet for accurate decomposition of mixed oxidation states for Mn XAS and EELS L2,3 edges without reference and calibrationZhengran Ji, Mike Hu, Huolin L Xin
Scientific Reports|December 23, 2022
Electron energy loss spectroscopy database synthesis and automation of core-loss edge recognition by deep-learning neural networksLingli Kong, Zhengran Ji, Huolin L Xin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 3, 2010
Extended depth of field for high-resolution scanning transmission electron microscopyRobert Hovden, Huolin L Xin, David A Muller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2012
Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEMHuolin L Xin, Ye Zhu, David A Muller
Ultramicroscopy|August 2, 2008
Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopesVarat Intaraprasonk, Huolin L Xin, David A Muller
Pageof 15