Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Hussam Muhamedsalih

Showing results (1-10 of 6) with videos related to

Pageof 1
Sort By:
Applied Optics|December 25, 2012
Comparison study of algorithms and accuracy in the wavelength scanning interferometryHussam Muhamedsalih, Feng Gao, Xiangqian Jiang
Optics Express|October 6, 2012
Surface and thickness measurement of a transparent film using wavelength scanning interferometryFeng Gao, Hussam Muhamedsalih, Xiangqian Jiang
Applied Optics|May 22, 2010
Fast surface measurement using wavelength scanning interferometry with compensation of environmental noiseXiangqian Jiang, Kaiwei Wang, Feng Gao, et al.
Optics Express|March 18, 2026
Chromatic focus variation with projected pattern illumination for wide range surface measurementsAalim M Mustafa, Hussam Muhamedsalih, Dawei Tang, et al.
Optics Express|June 14, 2025
Chromatic focus variation microscopy for surface metrologyAalim M Mustafa, Hussam Muhamedsalih, Dawei Tang, et al.
Applied Optics|April 1, 2018
Improvement of the fringe analysis algorithm for wavelength scanning interferometry based on filter parameter optimizationTao Zhang, Feng Gao, Hussam Muhamedsalih, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Applied Optics|December 25, 2012
Comparison study of algorithms and accuracy in the wavelength scanning interferometryHussam Muhamedsalih, Feng Gao, Xiangqian Jiang
Optics Express|October 6, 2012
Surface and thickness measurement of a transparent film using wavelength scanning interferometryFeng Gao, Hussam Muhamedsalih, Xiangqian Jiang
Applied Optics|May 22, 2010
Fast surface measurement using wavelength scanning interferometry with compensation of environmental noiseXiangqian Jiang, Kaiwei Wang, Feng Gao, et al.
Optics Express|March 18, 2026
Chromatic focus variation with projected pattern illumination for wide range surface measurementsAalim M Mustafa, Hussam Muhamedsalih, Dawei Tang, et al.
Optics Express|June 14, 2025
Chromatic focus variation microscopy for surface metrologyAalim M Mustafa, Hussam Muhamedsalih, Dawei Tang, et al.
Applied Optics|April 1, 2018
Improvement of the fringe analysis algorithm for wavelength scanning interferometry based on filter parameter optimizationTao Zhang, Feng Gao, Hussam Muhamedsalih, et al.
Pageof 1