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Journal of Nanoscience and Nanotechnology|November 30, 2018
Breakdown Voltage Enhancement in AlGaN/GaN High-Electron Mobility Transistor by Optimizing Gate Field-Plate StructureYe-Jin Park, Hyeon-Tak Kwak, Seung-Bo Chang, et al.
Journal of Nanoscience and Nanotechnology|April 22, 2018
Thermal Analysis of AlGaN/GaN High-Electron-Mobility Transistor and Its RF Power Efficiency Optimization with Source-Bridged Field-Plate StructureHyeon-Tak Kwak, Seung-Bo Chang, Hyun-Gu Jung, et al.
Optics Express|November 29, 2023
Enhanced near-infrared photodetection via whispering gallery modes in the wave-shaped sidewall silicon nanopillar arraysMinkeun Choi, Hyeon-Tak Kwak, Hyangwoo Kim, et al.
Nanoscale Research Letters|February 23, 2022
Highly Reliable Memory Operation of High-Density Three-Terminal Thyristor Random Access MemoryHyangwoo Kim, Hyeonsu Cho, Hyeon-Tak Kwak, et al.
Journal of Nanoscience and Nanotechnology|November 30, 2018
DC Characteristics of AlGaN/GaN High-Electron Mobility Transistor with a Bottom Plate Connected to Source-Bridged Field Plate StructureHyeon-Tak Kwak, Kyu-Won Jang, Hyun-Jung Kim, et al.
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