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I Vayshenker

Showing results (1-10 of 10) with videos related to

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Journal of Research of the National Institute of Standards and Technology|December 8, 2021
Optical-Fiber Power Meter Comparison between NIST and LAMETROI Vayshenker, J Jimenez, M P Ugalde, et al.
Applied Optics|January 12, 2010
Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and the National Metrology Institute of Japan at 1480 nmI Vayshenker, S Yang, K Amemiya, et al.
Journal of Research of the National Institute of Standards and Technology|July 15, 2016
Optical-Fiber Power Meter Comparison Between NIST and PTBI Vayshenker, H Haars, X Li, et al.
Journal of Research of the National Institute of Standards and Technology|February 23, 2016
Optical-Fiber Power Meter Comparison between NIST and KRISSI Vayshenker, S K Kim, K Hong, et al.
Journal of Research of the National Institute of Standards and Technology|May 3, 2016
Optical Fiber Power Meter Comparison Between NIST and NIMI Vayshenker, D J Livigni, X Li, et al.
Optics Express|May 15, 2020
Nature of fiber-coupled detector responsivity measurements at 0.1% using a primary standardM G White, E Baumann, I Vayshenker, et al.
Optics Express|October 19, 2017
Verification of calibration methods for determining photon-counting detection efficiency using superconducting nano-wire single photon detectorsI Mueller, R D Horansky, J H Lehman, et al.
Journal of Research of the National Institute of Standards and Technology|April 21, 2016
Bilateral Optical Power Meter Comparison Between NIST and CENAMI Vayshenker, X Li, D J Livigni, et al.
Applied Optics|February 7, 2007
Trilateral optical powermeter comparison between NIST, NMIJ/AIST, and METASI Vayshenker, J H Lehman, D J Livigni, et al.
Optics Express|February 3, 2016
High-efficiency superconducting nanowire single-photon detectors fabricated from MoSi thin-filmsV B Verma, B Korzh, F Bussières, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Journal of Research of the National Institute of Standards and Technology|December 8, 2021
Optical-Fiber Power Meter Comparison between NIST and LAMETROI Vayshenker, J Jimenez, M P Ugalde, et al.
Applied Optics|January 12, 2010
Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and the National Metrology Institute of Japan at 1480 nmI Vayshenker, S Yang, K Amemiya, et al.
Journal of Research of the National Institute of Standards and Technology|July 15, 2016
Optical-Fiber Power Meter Comparison Between NIST and PTBI Vayshenker, H Haars, X Li, et al.
Journal of Research of the National Institute of Standards and Technology|February 23, 2016
Optical-Fiber Power Meter Comparison between NIST and KRISSI Vayshenker, S K Kim, K Hong, et al.
Journal of Research of the National Institute of Standards and Technology|May 3, 2016
Optical Fiber Power Meter Comparison Between NIST and NIMI Vayshenker, D J Livigni, X Li, et al.
Optics Express|May 15, 2020
Nature of fiber-coupled detector responsivity measurements at 0.1% using a primary standardM G White, E Baumann, I Vayshenker, et al.
Optics Express|October 19, 2017
Verification of calibration methods for determining photon-counting detection efficiency using superconducting nano-wire single photon detectorsI Mueller, R D Horansky, J H Lehman, et al.
Journal of Research of the National Institute of Standards and Technology|April 21, 2016
Bilateral Optical Power Meter Comparison Between NIST and CENAMI Vayshenker, X Li, D J Livigni, et al.
Applied Optics|February 7, 2007
Trilateral optical powermeter comparison between NIST, NMIJ/AIST, and METASI Vayshenker, J H Lehman, D J Livigni, et al.
Optics Express|February 3, 2016
High-efficiency superconducting nanowire single-photon detectors fabricated from MoSi thin-filmsV B Verma, B Korzh, F Bussières, et al.
Pageof 1