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J S Villarrubia

Showing results (1-10 of 8) with videos related to

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Journal of Research of the National Institute of Standards and Technology|January 1, 1997
Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip EstimationJ S Villarrubia
Ultramicroscopy|April 17, 2007
General three-dimensional image simulation and surface reconstruction in scanning probe microscopy using a dexel representationXiaoping Qian, J S Villarrubia
Science (New York, N.Y.)|May 18, 1990
Identification of the products from the reaction of chlorine with the silicon(111)-(7x7) surfaceJ J Boland, J S Villarrubia
Ultramicroscopy|October 7, 2008
Blind estimation of general tip shape in AFM imagingFenglei Tian, Xiaoping Qian, J S Villarrubia
Proceedings of Spie--The International Society for Optical Engineering|July 25, 2017
Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetryJ S Villarrubia, V N Tondare, A E Vladár
APL Materials|April 16, 2019
Electron beam-based metrology after CMOSJ A Liddle, B D Hoskins, A E Vladár, et al.
Ultramicroscopy|March 10, 2015
Scanning electron microscope measurement of width and shape of 10nm patterned lines using a JMONSEL-modeled libraryJ S Villarrubia, A E Vladár, B Ming, et al.
Nanotechnology|February 5, 2015
New insights into subsurface imaging of carbon nanotubes in polymer composites via scanning electron microscopyMinhua Zhao, Bin Ming, Jae-Woo Kim, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Journal of Research of the National Institute of Standards and Technology|January 1, 1997
Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip EstimationJ S Villarrubia
Ultramicroscopy|April 17, 2007
General three-dimensional image simulation and surface reconstruction in scanning probe microscopy using a dexel representationXiaoping Qian, J S Villarrubia
Science (New York, N.Y.)|May 18, 1990
Identification of the products from the reaction of chlorine with the silicon(111)-(7x7) surfaceJ J Boland, J S Villarrubia
Ultramicroscopy|October 7, 2008
Blind estimation of general tip shape in AFM imagingFenglei Tian, Xiaoping Qian, J S Villarrubia
Proceedings of Spie--The International Society for Optical Engineering|July 25, 2017
Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetryJ S Villarrubia, V N Tondare, A E Vladár
APL Materials|April 16, 2019
Electron beam-based metrology after CMOSJ A Liddle, B D Hoskins, A E Vladár, et al.
Ultramicroscopy|March 10, 2015
Scanning electron microscope measurement of width and shape of 10nm patterned lines using a JMONSEL-modeled libraryJ S Villarrubia, A E Vladár, B Ming, et al.
Nanotechnology|February 5, 2015
New insights into subsurface imaging of carbon nanotubes in polymer composites via scanning electron microscopyMinhua Zhao, Bin Ming, Jae-Woo Kim, et al.
Pageof 1