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Joseph B Bernstein

Showing results (1-10 of 7) with videos related to

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Entropy (Basel, Switzerland)|June 26, 2026
Correlation Entropy and Power-Law KineticsJoseph B Bernstein
Micromachines|September 27, 2025
Power-Law Reliability Plotting for MicroelectronicsJoseph B Bernstein
Sensors (Basel, Switzerland)|April 3, 2021
Microchip Health Monitoring System Using the FLL CircuitEmmanuel Bender, Joseph B Bernstein
Micromachines|March 28, 2026
A Physics-Consistent Framework for Semiconductor Device Reliability Including Multiple Degradation MechanismsJoseph B Bernstein, Tsuriel Avraham, Bin Wang
Micromachines|March 28, 2024
Modern Trends in Microelectronics Packaging Reliability TestingEmmanuel Bender, Joseph B Bernstein, Duane S Boning
Micromachines|January 28, 2026
Cross Comparison Between Thermal Cycling and High Temperature Stress on I/O Connection ElementsMamta Dhyani, Tsuriel Avraham, Joseph B Bernstein, et al.
Micromachines|December 31, 2025
Power-Law Time Exponent <i>n</i> and Time-to-Failure in 4H-SiC MOSFETs: Beyond Fixed Reaction-Diffusion TheoryMamta Dhyani, Smriti Singh, Nir Tzhayek, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Entropy (Basel, Switzerland)|June 26, 2026
Correlation Entropy and Power-Law KineticsJoseph B Bernstein
Micromachines|September 27, 2025
Power-Law Reliability Plotting for MicroelectronicsJoseph B Bernstein
Sensors (Basel, Switzerland)|April 3, 2021
Microchip Health Monitoring System Using the FLL CircuitEmmanuel Bender, Joseph B Bernstein
Micromachines|March 28, 2026
A Physics-Consistent Framework for Semiconductor Device Reliability Including Multiple Degradation MechanismsJoseph B Bernstein, Tsuriel Avraham, Bin Wang
Micromachines|March 28, 2024
Modern Trends in Microelectronics Packaging Reliability TestingEmmanuel Bender, Joseph B Bernstein, Duane S Boning
Micromachines|January 28, 2026
Cross Comparison Between Thermal Cycling and High Temperature Stress on I/O Connection ElementsMamta Dhyani, Tsuriel Avraham, Joseph B Bernstein, et al.
Micromachines|December 31, 2025
Power-Law Time Exponent <i>n</i> and Time-to-Failure in 4H-SiC MOSFETs: Beyond Fixed Reaction-Diffusion TheoryMamta Dhyani, Smriti Singh, Nir Tzhayek, et al.
Pageof 1