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Julie M Cairney

Showing results (1-10 of 62) with videos related to

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Journal of Microscopy|February 21, 2025
Uncertainties in interfacial excess calculations from atom probe tomography dataLevi Tegg, Julie M Cairney
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 6, 2024
Estimation of the Electric Field in Atom Probe Tomography Experiments Using Charge State RatiosLevi Tegg, Leigh T Stephenson, Julie M Cairney
Ultramicroscopy|November 2, 2015
A simple approach to atom probe sample preparation by using shadow masksPeter Felfer, Ingrid McCarroll, Chandra Macauley, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 3, 2024
Characterization of Carbide Precipitation in Low-Carbon Martensitic Steels Using an Ultrawide Field-of-View 3D Atom ProbeHidekazu Minami, Levi Tegg, Takanori Sato, et al.
Ultramicroscopy|April 27, 2010
Optimization of pulsed laser atom probe (PLAP) for the analysis of nanocomposite Ti-Si-N filmsFengzai Tang, Baptiste Gault, Simon P Ringer, et al.
Ultramicroscopy|September 9, 2015
Mapping interfacial excess in atom probe dataPeter Felfer, Barbara Scherrer, Jelle Demeulemeester, et al.
Ultramicroscopy|October 26, 2024
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffractionGlenn C Sneddon, Patrick W Trimby, Levi Tegg, et al.
Angewandte Chemie (International Ed. in English)|August 21, 2014
Revealing the distribution of the atoms within individual bimetallic catalyst nanoparticlesPeter Felfer, Paul Benndorf, Anthony Masters, et al.
Ultramicroscopy|April 22, 2015
The effect orientation of features in reconstructed atom probe data on the resolution and measured composition of T1 plates in an A2198 aluminium alloyMaria A Mullin, Vicente J Araullo-Peters, Baptiste Gault, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 4, 2018
Interpreting Atom Probe Data from Oxide-Metal InterfacesIngrid McCarroll, Barbara Scherrer, Peter Felfer, et al.
Pageof 7

Showing results (1-10 of 62) with videos related to

Sort By:
Pageof 7
Journal of Microscopy|February 21, 2025
Uncertainties in interfacial excess calculations from atom probe tomography dataLevi Tegg, Julie M Cairney
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 6, 2024
Estimation of the Electric Field in Atom Probe Tomography Experiments Using Charge State RatiosLevi Tegg, Leigh T Stephenson, Julie M Cairney
Ultramicroscopy|November 2, 2015
A simple approach to atom probe sample preparation by using shadow masksPeter Felfer, Ingrid McCarroll, Chandra Macauley, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 3, 2024
Characterization of Carbide Precipitation in Low-Carbon Martensitic Steels Using an Ultrawide Field-of-View 3D Atom ProbeHidekazu Minami, Levi Tegg, Takanori Sato, et al.
Ultramicroscopy|April 27, 2010
Optimization of pulsed laser atom probe (PLAP) for the analysis of nanocomposite Ti-Si-N filmsFengzai Tang, Baptiste Gault, Simon P Ringer, et al.
Ultramicroscopy|September 9, 2015
Mapping interfacial excess in atom probe dataPeter Felfer, Barbara Scherrer, Jelle Demeulemeester, et al.
Ultramicroscopy|October 26, 2024
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffractionGlenn C Sneddon, Patrick W Trimby, Levi Tegg, et al.
Angewandte Chemie (International Ed. in English)|August 21, 2014
Revealing the distribution of the atoms within individual bimetallic catalyst nanoparticlesPeter Felfer, Paul Benndorf, Anthony Masters, et al.
Ultramicroscopy|April 22, 2015
The effect orientation of features in reconstructed atom probe data on the resolution and measured composition of T1 plates in an A2198 aluminium alloyMaria A Mullin, Vicente J Araullo-Peters, Baptiste Gault, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 4, 2018
Interpreting Atom Probe Data from Oxide-Metal InterfacesIngrid McCarroll, Barbara Scherrer, Peter Felfer, et al.
Pageof 7