Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Kamal Youcef-Toumi

Showing results (1-10 of 22) with videos related to

Pageof 3
Sort By:
Biosensors|December 23, 2022
Review: Advanced Atomic Force Microscopy Modes for Biomedical ResearchFangzhou Xia, Kamal Youcef-Toumi
Applied Optics|May 8, 2004
Design of a mechanical-tunable filter spectrometer for noninvasive glucose measurementVidi Saptari, Kamal Youcef-Toumi
Journal of Biomedical Optics|January 18, 2006
Measurements and quality assessments of near-infrared plasma glucose spectra in the combination band region using a scanning filter spectrometerVidi Saptari, Kamal Youcef-Toumi
Optics Express|October 7, 2021
Quantification and reduction of Poisson-Gaussian mixed noise induced errors in ellipsometryBo Jiang, Kai Meng, Kamal Youcef-Toumi
ISA Transactions|December 4, 2014
Event triggered state estimation techniques for power systems with integrated variable energy resourcesReshma C Francy, Amro M Farid, Kamal Youcef-Toumi
Optics Express|August 19, 2009
White-light scanning interferometer for absolute nano-scale gap thickness measurementZhiguang Xu, Vijay Shilpiekandula, Kamal Youcef-toumi, et al.
Biotechnology Journal|February 20, 2009
Extracting cancer cell line electrochemical parameters at the single cell level using a microfabricated deviceJassim A Alqabandi, Ussama M Abdel-Motal, Kamal Youcef-Toumi
Nanotechnology|May 22, 2015
Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopyAndreas Schuh, Iman Soltani Bozchalooi, Ivo W Rangelow, et al.
Optics Express|June 6, 2019
Unevenly spaced continuous measurement approach for dual rotating-retarder Mueller matrix ellipsometryKai Meng, Bo Jiang, Christos D Samolis, et al.
Journal of Visualized Experiments : Jove|July 3, 2023
Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample InspectionFangzhou Xia, Kamal Youcef-Toumi, Thomas Sattel, et al.
Pageof 3

Showing results (1-10 of 22) with videos related to

Sort By:
Pageof 3
Biosensors|December 23, 2022
Review: Advanced Atomic Force Microscopy Modes for Biomedical ResearchFangzhou Xia, Kamal Youcef-Toumi
Applied Optics|May 8, 2004
Design of a mechanical-tunable filter spectrometer for noninvasive glucose measurementVidi Saptari, Kamal Youcef-Toumi
Journal of Biomedical Optics|January 18, 2006
Measurements and quality assessments of near-infrared plasma glucose spectra in the combination band region using a scanning filter spectrometerVidi Saptari, Kamal Youcef-Toumi
Optics Express|October 7, 2021
Quantification and reduction of Poisson-Gaussian mixed noise induced errors in ellipsometryBo Jiang, Kai Meng, Kamal Youcef-Toumi
ISA Transactions|December 4, 2014
Event triggered state estimation techniques for power systems with integrated variable energy resourcesReshma C Francy, Amro M Farid, Kamal Youcef-Toumi
Optics Express|August 19, 2009
White-light scanning interferometer for absolute nano-scale gap thickness measurementZhiguang Xu, Vijay Shilpiekandula, Kamal Youcef-toumi, et al.
Biotechnology Journal|February 20, 2009
Extracting cancer cell line electrochemical parameters at the single cell level using a microfabricated deviceJassim A Alqabandi, Ussama M Abdel-Motal, Kamal Youcef-Toumi
Nanotechnology|May 22, 2015
Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopyAndreas Schuh, Iman Soltani Bozchalooi, Ivo W Rangelow, et al.
Optics Express|June 6, 2019
Unevenly spaced continuous measurement approach for dual rotating-retarder Mueller matrix ellipsometryKai Meng, Bo Jiang, Christos D Samolis, et al.
Journal of Visualized Experiments : Jove|July 3, 2023
Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample InspectionFangzhou Xia, Kamal Youcef-Toumi, Thomas Sattel, et al.
Pageof 3