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Katsuichi Kitagawa

Showing results (1-10 of 10) with videos related to

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Applied Optics|April 3, 2013
Thin-film thickness profile measurement by three-wavelength interference color analysisKatsuichi Kitagawa
Optics Letters|August 15, 2014
Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometryKatsuichi Kitagawa
Applied Optics|August 29, 2002
Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theoryAkira Hirabayashi, Hidemitsu Ogawa, Katsuichi Kitagawa
Applied Optics|October 28, 2006
Single-shot surface profiling by local model fittingMasashi Sugiyama, Hidemitsu Ogawa, Katsuichi Kitagawa, et al.
Applied Optics|October 4, 2012
Multiwavelength-integrated local model fitting method for interferometric surface profilingAkihiro Yamashita, Masashi Sugiyama, Katsuichi Kitagawa, et al.
Applied Optics|June 14, 2013
Improved algorithm for multiwavelength single-shot interferometric surface profiling: speeding up the multiwavelength-integrated local model fitting method by local information sharingKeisuke Nakata, Masashi Sugiyama, Katsuichi Kitagawa, et al.
Applied Optics|July 21, 2011
Automatic parameter optimization of the local model fitting method for single-shot surface profilingSyogo Mori, Masashi Sugiyama, Hidemitsu Ogawa, et al.
Applied Optics|June 23, 2009
Interpolated local model fitting method for accurate and fast single-shot surface profilingTatsuya Yokota, Masashi Sugiyama, Hidemitsu Ogawa, et al.
Applied Optics|August 3, 2010
Iteratively-reweighted local model fitting method for adaptive and accurate single-shot surface profilingNozomi Kurihara, Masashi Sugiyama, Hidemitsu Ogawa, et al.
The Review of Scientific Instruments|August 3, 2014
Fabrication of optical multilayer for two-color phase plate in super-resolution microscopeYoshinori Iketaki, Katsuichi Kitagawa, Kohjiro Hidaka, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Applied Optics|April 3, 2013
Thin-film thickness profile measurement by three-wavelength interference color analysisKatsuichi Kitagawa
Optics Letters|August 15, 2014
Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometryKatsuichi Kitagawa
Applied Optics|August 29, 2002
Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theoryAkira Hirabayashi, Hidemitsu Ogawa, Katsuichi Kitagawa
Applied Optics|October 28, 2006
Single-shot surface profiling by local model fittingMasashi Sugiyama, Hidemitsu Ogawa, Katsuichi Kitagawa, et al.
Applied Optics|October 4, 2012
Multiwavelength-integrated local model fitting method for interferometric surface profilingAkihiro Yamashita, Masashi Sugiyama, Katsuichi Kitagawa, et al.
Applied Optics|June 14, 2013
Improved algorithm for multiwavelength single-shot interferometric surface profiling: speeding up the multiwavelength-integrated local model fitting method by local information sharingKeisuke Nakata, Masashi Sugiyama, Katsuichi Kitagawa, et al.
Applied Optics|July 21, 2011
Automatic parameter optimization of the local model fitting method for single-shot surface profilingSyogo Mori, Masashi Sugiyama, Hidemitsu Ogawa, et al.
Applied Optics|June 23, 2009
Interpolated local model fitting method for accurate and fast single-shot surface profilingTatsuya Yokota, Masashi Sugiyama, Hidemitsu Ogawa, et al.
Applied Optics|August 3, 2010
Iteratively-reweighted local model fitting method for adaptive and accurate single-shot surface profilingNozomi Kurihara, Masashi Sugiyama, Hidemitsu Ogawa, et al.
The Review of Scientific Instruments|August 3, 2014
Fabrication of optical multilayer for two-color phase plate in super-resolution microscopeYoshinori Iketaki, Katsuichi Kitagawa, Kohjiro Hidaka, et al.
Pageof 1