Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Kazuo Ishizuka

Showing results (1-10 of 31) with videos related to

Pageof 4
Sort By:
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
FFT multislice method--the silver anniversaryKazuo Ishizuka
Microscopy (Oxford, England)|March 29, 2013
Phase retrieval from image intensities: why does exit wave restoration using IWFR work so well?Kazuo Ishizuka
Ultramicroscopy|July 12, 2011
Spatially resolved diffractometry with atomic-column resolutionKoji Kimoto, Kazuo Ishizuka
Journal of Electron Microscopy|August 4, 2005
Phase measurement of atomic resolution image using transport of intensity equationKazuo Ishizuka, Brendan Allman
Ultramicroscopy|March 28, 2017
Rapid measurement of low-order aberrations using Fourier transforms of crystalline RonchigramsKoji Kimoto, Kazuo Ishizuka
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 28, 2016
Why Do We Need to Use Three-Dimensional (3D) Fourier Transform (FT) Analysis to Evaluate a High-Performance Transmission Electron Microscope (TEM)?Kazuo Ishizuka, Koji Kimoto
Micron (Oxford, England : 1993)|September 13, 2008
Decisive factors for realizing atomic-column resolution using STEM and EELS Koji Kimoto, Kazuo Ishizuka, Yoshio Matsui
Journal of Electron Microscopy|September 22, 2009
Quantitativeness of phase measurement by transport of intensity equationMasanori Mitome, Kazuo Ishizuka, Yoshio Bando
Microscopy (Oxford, England)|March 25, 2017
STEM moiré analysis for 2D strain measurementsAkimitsu Ishizuka, Martin Hytch, Kazuo Ishizuka
Ultramicroscopy|July 24, 2018
Direct observation of curvature of the wave surface in transmission electron microscope using transport intensity equationAkimitsu Ishizuka, Kazutaka Mitsuishi, Kazuo Ishizuka
Pageof 4

Showing results (1-10 of 31) with videos related to

Sort By:
Pageof 4
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
FFT multislice method--the silver anniversaryKazuo Ishizuka
Microscopy (Oxford, England)|March 29, 2013
Phase retrieval from image intensities: why does exit wave restoration using IWFR work so well?Kazuo Ishizuka
Ultramicroscopy|July 12, 2011
Spatially resolved diffractometry with atomic-column resolutionKoji Kimoto, Kazuo Ishizuka
Journal of Electron Microscopy|August 4, 2005
Phase measurement of atomic resolution image using transport of intensity equationKazuo Ishizuka, Brendan Allman
Ultramicroscopy|March 28, 2017
Rapid measurement of low-order aberrations using Fourier transforms of crystalline RonchigramsKoji Kimoto, Kazuo Ishizuka
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 28, 2016
Why Do We Need to Use Three-Dimensional (3D) Fourier Transform (FT) Analysis to Evaluate a High-Performance Transmission Electron Microscope (TEM)?Kazuo Ishizuka, Koji Kimoto
Micron (Oxford, England : 1993)|September 13, 2008
Decisive factors for realizing atomic-column resolution using STEM and EELS Koji Kimoto, Kazuo Ishizuka, Yoshio Matsui
Journal of Electron Microscopy|September 22, 2009
Quantitativeness of phase measurement by transport of intensity equationMasanori Mitome, Kazuo Ishizuka, Yoshio Bando
Microscopy (Oxford, England)|March 25, 2017
STEM moiré analysis for 2D strain measurementsAkimitsu Ishizuka, Martin Hytch, Kazuo Ishizuka
Ultramicroscopy|July 24, 2018
Direct observation of curvature of the wave surface in transmission electron microscope using transport intensity equationAkimitsu Ishizuka, Kazutaka Mitsuishi, Kazuo Ishizuka
Pageof 4