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Journal of Electron Microscopy|December 8, 2004
HVEM characterization of crack tip dislocations in silicon crystalsMasaki Tanaka, Kenji HigashidaJournal of Electron Microscopy|December 8, 2004
HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting methodMasaki Tanaka, Kenji Higashida, Toru Fukui, et al.Ultramicroscopy|December 31, 2015
Transmission electron microscopy of bulk specimens over 10µm in thicknessSunao Sadamatsu, Masaki Tanaka, Kenji Higashida, et al.Journal of Electron Microscopy|June 17, 2010
3-D structures of crack-tip dislocations and their shielding effect revealed by electron tomographyMasaki Tanaka, Masaki Honda, Sunao Sadamatsu, et al.Microscopy (Oxford, England)|June 28, 2015
Crack tip shielding observed with high-resolution transmission electron microscopyDamar Rastri Adhika, Masaki Tanaka, Takeshi Daio, et al.Nano Letters|December 7, 2018
Electrochemical Degradation of Pt-Ni Nanocatalysts: An Identical Location Aberration-Corrected Scanning Transmission Electron Microscopy StudySomaye Rasouli, Deborah Myers, Nancy Kariuki, et al.Ultramicroscopy|August 11, 2010
A combined environmental straining specimen holder for high-voltage electron microscopyYoshimasa Takahashi, Masaki Tanaka, Kenji Higashida, et al.Pageof 1