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Knut Müller-Caspary

Showing results (1-10 of 55) with videos related to

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Iucrj|June 19, 2023
Dynamical scattering in ice-embedded proteins in conventional and scanning transmission electron microscopyMax Leo Leidl, Carsten Sachse, Knut Müller-Caspary
Ultramicroscopy|May 20, 2023
Advanced processing of differential phase contrast data: Distinction between different causes of electron phase shiftsJosef Zweck, Felix Schwarzhuber, Simon Pöllath, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 3, 2026
Gradient-Based Experimental Design for Defect Detection in MoS2 Including Emission Potentials for Thermal Diffuse ScatteringZiria Herdegen, Andreas Jehle, Lea Richter, et al.
Ultramicroscopy|May 8, 2026
The Cramér-Rao lower bound for the precision of scan position refinement in momentum-resolved STEMAndreas Jehle, Tizian Lorenzen, Max Leo Leidl, et al.
Micron (Oxford, England : 1993)|July 11, 2024
Influence of loss function and electron dose on ptychography of 2D materials using the Wirtinger flowMax Leo Leidl, Benedikt Diederichs, Carsten Sachse, et al.
Ultramicroscopy|January 20, 2020
Direct measurement of electrostatic potentials at the atomic scale: A conceptual comparison between electron holography and scanning transmission electron microscopyFlorian Winkler, Juri Barthel, Rafal E Dunin-Borkowski, et al.
Nature Communications|January 3, 2024
Exact inversion of partially coherent dynamical electron scattering for picometric structure retrievalBenedikt Diederichs, Ziria Herdegen, Achim Strauch, et al.
Ultramicroscopy|June 19, 2023
Characterization of a Timepix detector for use in SEM acceleration voltage rangeNikita Denisov, Daen Jannis, Andrey Orekhov, et al.
Ultramicroscopy|July 15, 2023
Quantitative electric field mapping between electrically biased needles by scanning transmission electron microscopy and electron holographyJean Felix Dushimineza, Janghyun Jo, Rafal E Dunin-Borkowski, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 24, 2025
Towards a Protein-Size Dependent Resolution Limit due to Dynamical Scattering in Cryo-transmission Electron MicroscopyMax Leo Leidl, Sebastian Sturm, Aikaterina Filopoulou, et al.
Pageof 6

Showing results (1-10 of 55) with videos related to

Sort By:
Pageof 6
Iucrj|June 19, 2023
Dynamical scattering in ice-embedded proteins in conventional and scanning transmission electron microscopyMax Leo Leidl, Carsten Sachse, Knut Müller-Caspary
Ultramicroscopy|May 20, 2023
Advanced processing of differential phase contrast data: Distinction between different causes of electron phase shiftsJosef Zweck, Felix Schwarzhuber, Simon Pöllath, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 3, 2026
Gradient-Based Experimental Design for Defect Detection in MoS2 Including Emission Potentials for Thermal Diffuse ScatteringZiria Herdegen, Andreas Jehle, Lea Richter, et al.
Ultramicroscopy|May 8, 2026
The Cramér-Rao lower bound for the precision of scan position refinement in momentum-resolved STEMAndreas Jehle, Tizian Lorenzen, Max Leo Leidl, et al.
Micron (Oxford, England : 1993)|July 11, 2024
Influence of loss function and electron dose on ptychography of 2D materials using the Wirtinger flowMax Leo Leidl, Benedikt Diederichs, Carsten Sachse, et al.
Ultramicroscopy|January 20, 2020
Direct measurement of electrostatic potentials at the atomic scale: A conceptual comparison between electron holography and scanning transmission electron microscopyFlorian Winkler, Juri Barthel, Rafal E Dunin-Borkowski, et al.
Nature Communications|January 3, 2024
Exact inversion of partially coherent dynamical electron scattering for picometric structure retrievalBenedikt Diederichs, Ziria Herdegen, Achim Strauch, et al.
Ultramicroscopy|June 19, 2023
Characterization of a Timepix detector for use in SEM acceleration voltage rangeNikita Denisov, Daen Jannis, Andrey Orekhov, et al.
Ultramicroscopy|July 15, 2023
Quantitative electric field mapping between electrically biased needles by scanning transmission electron microscopy and electron holographyJean Felix Dushimineza, Janghyun Jo, Rafal E Dunin-Borkowski, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 24, 2025
Towards a Protein-Size Dependent Resolution Limit due to Dynamical Scattering in Cryo-transmission Electron MicroscopyMax Leo Leidl, Sebastian Sturm, Aikaterina Filopoulou, et al.
Pageof 6