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Lewys Jones

Showing results (11-20 of 47) with videos related to

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Ultramicroscopy|March 16, 2023
Correcting for probe wandering by precession path segmentationGregory Nordahl, Lewys Jones, Emil Frang Christiansen, et al.
Microscopy (Oxford, England)|May 19, 2025
Auto-thresholding for Unbiased Electron CountingJulie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
Interlacing in Atomic Resolution Scanning Transmission Electron MicroscopyJonathan J P Peters, Tiarnan Mullarkey, James A Gott, et al.
Micron (Oxford, England : 1993)|July 16, 2018
Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEMAakash Varambhia, Lewys Jones, Andrew London, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 13, 2024
Ultra-fast Digital DPC Yielding High Spatio-temporal Resolution for Low-Dose Phase CharacterizationJulie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, et al.
ACS Omega|January 16, 2023
Templated Synthesis of SiO<sub>2</sub> Nanotubes for Lithium-Ion Battery Applications: An In Situ (Scanning) Transmission Electron Microscopy StudyOskar Ronan, Ahin Roy, Sean Ryan, et al.
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
How Fast is Your Detector? The Effect of Temporal Response on Image QualityTiarnan Mullarkey, Matthew Geever, Jonathan J P Peters, et al.
Nano Letters|October 24, 2014
Rapid estimation of catalyst nanoparticle morphology and atomic-coordination by high-resolution Z-contrast electron microscopyLewys Jones, Katherine E MacArthur, Vidar T Fauske, et al.
Physical Review Letters|March 29, 2020
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron MicroscopyAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Pageof 5

Showing results (11-20 of 47) with videos related to

Sort By:
Pageof 5
Ultramicroscopy|March 16, 2023
Correcting for probe wandering by precession path segmentationGregory Nordahl, Lewys Jones, Emil Frang Christiansen, et al.
Microscopy (Oxford, England)|May 19, 2025
Auto-thresholding for Unbiased Electron CountingJulie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
Interlacing in Atomic Resolution Scanning Transmission Electron MicroscopyJonathan J P Peters, Tiarnan Mullarkey, James A Gott, et al.
Micron (Oxford, England : 1993)|July 16, 2018
Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEMAakash Varambhia, Lewys Jones, Andrew London, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 13, 2024
Ultra-fast Digital DPC Yielding High Spatio-temporal Resolution for Low-Dose Phase CharacterizationJulie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, et al.
ACS Omega|January 16, 2023
Templated Synthesis of SiO<sub>2</sub> Nanotubes for Lithium-Ion Battery Applications: An In Situ (Scanning) Transmission Electron Microscopy StudyOskar Ronan, Ahin Roy, Sean Ryan, et al.
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
How Fast is Your Detector? The Effect of Temporal Response on Image QualityTiarnan Mullarkey, Matthew Geever, Jonathan J P Peters, et al.
Nano Letters|October 24, 2014
Rapid estimation of catalyst nanoparticle morphology and atomic-coordination by high-resolution Z-contrast electron microscopyLewys Jones, Katherine E MacArthur, Vidar T Fauske, et al.
Physical Review Letters|March 29, 2020
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron MicroscopyAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Pageof 5