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Ultramicroscopy|June 14, 2013
Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitationsA De Backer, G T Martinez, A Rosenauer, et al.Ultramicroscopy|October 13, 2022
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectorsD G Sentürk, A De Backer, T Friedrich, et al.Ultramicroscopy|October 1, 2023
Atom counting from a combination of two ADF STEM imagesD G Şentürk, C P Yu, A De Backer, et al.Ultramicroscopy|November 26, 2013
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopyG T Martinez, A Rosenauer, A De Backer, et al.Micron (Oxford, England : 1993)|January 28, 2014
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy imagesG T Martinez, A De Backer, A Rosenauer, et al.Ultramicroscopy|July 4, 2013
Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?A J den Dekker, J Gonnissen, A De Backer, et al.Ultramicroscopy|March 10, 2017
Atom-counting in High Resolution Electron Microscopy:TEM or STEM - That's the questionJ Gonnissen, A De Backer, A J den Dekker, et al.Ultramicroscopy|September 5, 2016
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal designJ Gonnissen, A De Backer, A J den Dekker, et al.Ultramicroscopy|June 2, 2006
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic imagesM D Croitoru, D Van Dyck, S Van Aert, et al.Ultramicroscopy|December 27, 2008
Effect of amorphous layers on the interpretation of restored exit wavesS Van Aert, L Y Chang, S Bals, et al.Pageof 21