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Marcus Trost

Showing results (1-10 of 17) with videos related to

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Applied Optics|May 3, 2023
Optical interference coatings: measurement problem 2022 [Invited]Marcus Trost, Sven Schröder, Florian Carstens, et al.
Applied Optics|April 1, 2020
Optical interference coatings measurement problem 2019 [Invited]Marcus Trost, Angela Duparré, Detlev Ristau, et al.
Applied Optics|March 20, 2010
Angle-resolved scattering and reflectance of extreme-ultraviolet multilayer coatings: measurement and analysisSven Schröder, Tobias Herffurth, Marcus Trost, et al.
Applied Optics|May 15, 2013
Comprehensive nanostructure and defect analysis using a simple 3D light-scatter sensorTobias Herffurth, Sven Schröder, Marcus Trost, et al.
Applied Optics|February 12, 2014
Scattering reduction through oblique multilayer depositionMarcus Trost, Tobias Herffurth, Sven Schröder, et al.
Applied Optics|April 5, 2011
Influence of the substrate finish and thin film roughness on the optical performance of Mo/Si multilayersMarcus Trost, Sven Schröder, Torsten Feigl, et al.
Applied Optics|February 12, 2014
Spectral angle resolved scattering of thin film coatingsSven Schröder, David Unglaub, Marcus Trost, et al.
Applied Optics|October 18, 2022
Topography stitching in the spatial frequency domain for the representation of mid-spatial frequency errorsYusuf Sekman, Marcus Trost, Tom Lammers, et al.
Applied Optics|October 3, 2013
Evaluation of subsurface damage by light scattering techniquesMarcus Trost, Tobias Herffurth, David Schmitz, et al.
Optics Express|July 19, 2020
Influence of seed layers on optical properties of aluminum in the UV rangeSven Stempfhuber, Nadja Felde, Stefan Schwinde, et al.
Pageof 2

Showing results (1-10 of 17) with videos related to

Sort By:
Pageof 2
Applied Optics|May 3, 2023
Optical interference coatings: measurement problem 2022 [Invited]Marcus Trost, Sven Schröder, Florian Carstens, et al.
Applied Optics|April 1, 2020
Optical interference coatings measurement problem 2019 [Invited]Marcus Trost, Angela Duparré, Detlev Ristau, et al.
Applied Optics|March 20, 2010
Angle-resolved scattering and reflectance of extreme-ultraviolet multilayer coatings: measurement and analysisSven Schröder, Tobias Herffurth, Marcus Trost, et al.
Applied Optics|May 15, 2013
Comprehensive nanostructure and defect analysis using a simple 3D light-scatter sensorTobias Herffurth, Sven Schröder, Marcus Trost, et al.
Applied Optics|February 12, 2014
Scattering reduction through oblique multilayer depositionMarcus Trost, Tobias Herffurth, Sven Schröder, et al.
Applied Optics|April 5, 2011
Influence of the substrate finish and thin film roughness on the optical performance of Mo/Si multilayersMarcus Trost, Sven Schröder, Torsten Feigl, et al.
Applied Optics|February 12, 2014
Spectral angle resolved scattering of thin film coatingsSven Schröder, David Unglaub, Marcus Trost, et al.
Applied Optics|October 18, 2022
Topography stitching in the spatial frequency domain for the representation of mid-spatial frequency errorsYusuf Sekman, Marcus Trost, Tom Lammers, et al.
Applied Optics|October 3, 2013
Evaluation of subsurface damage by light scattering techniquesMarcus Trost, Tobias Herffurth, David Schmitz, et al.
Optics Express|July 19, 2020
Influence of seed layers on optical properties of aluminum in the UV rangeSven Stempfhuber, Nadja Felde, Stefan Schwinde, et al.
Pageof 2