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N R Lugg

Showing results (1-10 of 7) with videos related to

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Ultramicroscopy|December 24, 2014
On the quantitativeness of EDS STEMN R Lugg, G Kothleitner, N Shibata, et al.
Ultramicroscopy|June 18, 2018
On the quantitativeness of grain boundary chemistry using STEM EDS: A ZrO<sub>2</sub> Σ9 model grain boundary case studyB Feng, N R Lugg, A Kumamoto, et al.
Ultramicroscopy|July 12, 2011
Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: a theoretical studyS D Findlay, N R Lugg, N Shibata, et al.
Physical Review Letters|May 21, 2013
Achromatic elemental mapping beyond the nanoscale in the transmission electron microscopeK W Urban, J Mayer, J R Jinschek, et al.
Ultramicroscopy|December 18, 2016
A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imagingH G Brown, R Ishikawa, G Sánchez-Santolino, et al.
Ultramicroscopy|July 12, 2011
Scanning transmission electron microscopy imaging dynamics at low accelerating voltagesN R Lugg, S D Findlay, N Shibata, et al.
Ultramicroscopy|August 24, 2013
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM imagesH E, K E Macarthur, T J Pennycook, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|December 24, 2014
On the quantitativeness of EDS STEMN R Lugg, G Kothleitner, N Shibata, et al.
Ultramicroscopy|June 18, 2018
On the quantitativeness of grain boundary chemistry using STEM EDS: A ZrO<sub>2</sub> Σ9 model grain boundary case studyB Feng, N R Lugg, A Kumamoto, et al.
Ultramicroscopy|July 12, 2011
Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: a theoretical studyS D Findlay, N R Lugg, N Shibata, et al.
Physical Review Letters|May 21, 2013
Achromatic elemental mapping beyond the nanoscale in the transmission electron microscopeK W Urban, J Mayer, J R Jinschek, et al.
Ultramicroscopy|December 18, 2016
A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imagingH G Brown, R Ishikawa, G Sánchez-Santolino, et al.
Ultramicroscopy|July 12, 2011
Scanning transmission electron microscopy imaging dynamics at low accelerating voltagesN R Lugg, S D Findlay, N Shibata, et al.
Ultramicroscopy|August 24, 2013
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM imagesH E, K E Macarthur, T J Pennycook, et al.
Pageof 1